TRANSIENT EFFECTS IN SUBMICRON DEVICES - LOAD LINE DEPENDENCE.

H. L. Grubin, D. K. Ferry, J. R. Barker

Research output: Chapter in Book/Report/Conference proceedingChapter

4 Citations (Scopus)

Abstract

Authors compute the transient response of gallium arsenide submicron two terminal devices and examine their load line dependence.

Original languageEnglish (US)
Title of host publicationAdvances in Chemistry Series
Place of PublicationNew York, NY
PublisherIEEE
Pages394-397
Number of pages4
StatePublished - 1979
Externally publishedYes
EventInt Electron Devices Meet, 25th, Tech Dig - Washington, DC, USA
Duration: Dec 3 1979Dec 5 1979

Other

OtherInt Electron Devices Meet, 25th, Tech Dig
CityWashington, DC, USA
Period12/3/7912/5/79

Fingerprint

Gallium arsenide
Transient analysis

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Grubin, H. L., Ferry, D. K., & Barker, J. R. (1979). TRANSIENT EFFECTS IN SUBMICRON DEVICES - LOAD LINE DEPENDENCE. In Advances in Chemistry Series (pp. 394-397). New York, NY: IEEE.

TRANSIENT EFFECTS IN SUBMICRON DEVICES - LOAD LINE DEPENDENCE. / Grubin, H. L.; Ferry, D. K.; Barker, J. R.

Advances in Chemistry Series. New York, NY : IEEE, 1979. p. 394-397.

Research output: Chapter in Book/Report/Conference proceedingChapter

Grubin, HL, Ferry, DK & Barker, JR 1979, TRANSIENT EFFECTS IN SUBMICRON DEVICES - LOAD LINE DEPENDENCE. in Advances in Chemistry Series. IEEE, New York, NY, pp. 394-397, Int Electron Devices Meet, 25th, Tech Dig, Washington, DC, USA, 12/3/79.
Grubin HL, Ferry DK, Barker JR. TRANSIENT EFFECTS IN SUBMICRON DEVICES - LOAD LINE DEPENDENCE. In Advances in Chemistry Series. New York, NY: IEEE. 1979. p. 394-397
Grubin, H. L. ; Ferry, D. K. ; Barker, J. R. / TRANSIENT EFFECTS IN SUBMICRON DEVICES - LOAD LINE DEPENDENCE. Advances in Chemistry Series. New York, NY : IEEE, 1979. pp. 394-397
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