Transient analysis of distortion and coupling in lossy coupled microstrips

James P. Gilb, Constantine Balanis

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The transient response of lossy coupled microstrips is studied using the spectral domain approach (SDA) to compute rigorously the dielectric losses. Transient coupling is formulated in the frequency domain using an even/odd mode approach. Results for pulse distortion on a semiconducting substrate are presented showing how losses reduce the signal amplitude without significantly distorting the shape. Distortion due to even/odd mode coupling was the dominant distortion mechanism, while coupling due to differences in the modal attenuation constants had a secondary effect.

Original languageEnglish (US)
Pages (from-to)641-644
Number of pages4
JournalIEEE MTT-S International Microwave Symposium Digest
Volume2
StatePublished - 1990

Fingerprint

Transient analysis
transient response
Dielectric losses
dielectric loss
coupled modes
attenuation
Substrates
pulses

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Transient analysis of distortion and coupling in lossy coupled microstrips. / Gilb, James P.; Balanis, Constantine.

In: IEEE MTT-S International Microwave Symposium Digest, Vol. 2, 1990, p. 641-644.

Research output: Contribution to journalArticle

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