Transfer Function analysis using STFT for improvement of the fault detection sensitivity in transformer impulse test

Essam Al-Ammar, George G. Karady

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

Insulation of transformer windings may shift as a result of short circuit current or impact during transportation. The shift modifies the dielectric space between the layers of the windings and may cause an insulation breakdown, leading to a complete transformer failure. As transformers are very costly to replace, it is important that their condition determined accurately without having to dismantle the apparatus to visually inspect it. Testing of winding insulation is performed by using the standard impulse test, via applying fast Fourier transform (FFT) to analyze the transformer state (healthy or faulty) in the frequency domain, as a Transfer Function (TF). Nonetheless, one of the shortcomings of the FFT is that it cannot be used with nonstationary signals. Voltage and current waveforms in the transformer are treated as nonstationary signals, especially when there is a fault. In addition, FFT does not give any information on the time at which a frequency component occurs. To obtain better signature analysis and to increase the detection sensitivity, this paper suggests a new method using Short Time Fourier Transform (STFT) in the transfer function analysis. It is hoped that this high resolution method will help to reduce the subjective judgments of technicians when making decisions about changes in the winding structure of the transformer.

Original languageEnglish (US)
Title of host publication2005 IEEE Power Engineering Society General Meeting
Pages1855-1862
Number of pages8
Volume2
StatePublished - 2005
Event2005 IEEE Power Engineering Society General Meeting - San Francisco, CA, United States
Duration: Jun 12 2005Jun 16 2005

Other

Other2005 IEEE Power Engineering Society General Meeting
CountryUnited States
CitySan Francisco, CA
Period6/12/056/16/05

Fingerprint

Fault detection
Fast Fourier transforms
Transfer functions
Insulation
Fourier transforms
Transformer windings
Short circuit currents
Decision making
Testing
Electric potential

Keywords

  • EMTP
  • Faults
  • Signature analysis
  • Time-frequency representation
  • Transformer

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Al-Ammar, E., & Karady, G. G. (2005). Transfer Function analysis using STFT for improvement of the fault detection sensitivity in transformer impulse test. In 2005 IEEE Power Engineering Society General Meeting (Vol. 2, pp. 1855-1862)

Transfer Function analysis using STFT for improvement of the fault detection sensitivity in transformer impulse test. / Al-Ammar, Essam; Karady, George G.

2005 IEEE Power Engineering Society General Meeting. Vol. 2 2005. p. 1855-1862.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Al-Ammar, E & Karady, GG 2005, Transfer Function analysis using STFT for improvement of the fault detection sensitivity in transformer impulse test. in 2005 IEEE Power Engineering Society General Meeting. vol. 2, pp. 1855-1862, 2005 IEEE Power Engineering Society General Meeting, San Francisco, CA, United States, 6/12/05.
Al-Ammar E, Karady GG. Transfer Function analysis using STFT for improvement of the fault detection sensitivity in transformer impulse test. In 2005 IEEE Power Engineering Society General Meeting. Vol. 2. 2005. p. 1855-1862
Al-Ammar, Essam ; Karady, George G. / Transfer Function analysis using STFT for improvement of the fault detection sensitivity in transformer impulse test. 2005 IEEE Power Engineering Society General Meeting. Vol. 2 2005. pp. 1855-1862
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