Towards selecting test data using topological structure of Boolean expressions

Lian Yu, Wei Tek Tsai, Wei Zhao, Jun Zhu, Qianxing Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Boolean expressions can be used in programs and specifications to describe the complex logic decisions in mission-critical, safety-critical and Web services applications. We define a topological model (T-model) to represent Boolean expressions and characterize the test data. This paper provides proofs of relevant T-model properties, employs the combinatorial design approach, and proposes a family of strategies and techniques to detect a variety of faults associated with Boolean expressions. We compare our strategies with MC/DC, MUMCUT, MANY-A, MANY-B, MAX-A and MAX-B, and conclude that T-model based approach detects more types of faults than MC/DC, MUMCUT MANY-A and MAX-A, and detects the same types but more instances of faults than MANY-B and MAX-B with much smaller test data set.

Original languageEnglish (US)
Title of host publicationQSIC 2009 - Proceedings of the 9th International Conference on Quality Software
Pages31-40
Number of pages10
DOIs
StatePublished - Dec 1 2009
Event9th International Conference on Quality Software, QSIC 2009 - Jeju, Korea, Republic of
Duration: Aug 24 2009Aug 25 2009

Publication series

NameProceedings - International Conference on Quality Software
ISSN (Print)1550-6002

Other

Other9th International Conference on Quality Software, QSIC 2009
CountryKorea, Republic of
CityJeju
Period8/24/098/25/09

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Yu, L., Tsai, W. T., Zhao, W., Zhu, J., & Wang, Q. (2009). Towards selecting test data using topological structure of Boolean expressions. In QSIC 2009 - Proceedings of the 9th International Conference on Quality Software (pp. 31-40). [5381532] (Proceedings - International Conference on Quality Software). https://doi.org/10.1109/QSIC.2009.13