Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy

Y. Zhu, A. Soukiassian, D. G. Schlom, D. A. Muller, Christian Dwyer

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3) 4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.

Original languageEnglish (US)
Article number141908
JournalApplied Physics Letters
Volume103
Issue number14
DOIs
StatePublished - 2013
Externally publishedYes

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artifacts
energy dissipation
electron energy
electron microscopes
spectroscopy
scanning
quantitative analysis
excitation
elastic scattering
probes
simulation
energy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy. / Zhu, Y.; Soukiassian, A.; Schlom, D. G.; Muller, D. A.; Dwyer, Christian.

In: Applied Physics Letters, Vol. 103, No. 14, 141908, 2013.

Research output: Contribution to journalArticle

Zhu, Y. ; Soukiassian, A. ; Schlom, D. G. ; Muller, D. A. ; Dwyer, Christian. / Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy. In: Applied Physics Letters. 2013 ; Vol. 103, No. 14.
@article{3f555a5e4ac8437086fb86d2d85665d5,
title = "Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy",
abstract = "Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3) 4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.",
author = "Y. Zhu and A. Soukiassian and Schlom, {D. G.} and Muller, {D. A.} and Christian Dwyer",
year = "2013",
doi = "10.1063/1.4823704",
language = "English (US)",
volume = "103",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "14",

}

TY - JOUR

T1 - Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy

AU - Zhu, Y.

AU - Soukiassian, A.

AU - Schlom, D. G.

AU - Muller, D. A.

AU - Dwyer, Christian

PY - 2013

Y1 - 2013

N2 - Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3) 4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.

AB - Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3) 4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.

UR - http://www.scopus.com/inward/record.url?scp=84885572031&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84885572031&partnerID=8YFLogxK

U2 - 10.1063/1.4823704

DO - 10.1063/1.4823704

M3 - Article

AN - SCOPUS:84885572031

VL - 103

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 14

M1 - 141908

ER -