Toward quantitative defect analysis using HREM

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Over the years, high resolution electron microscopy (HREM) has emerged as a very powerful tool for structure imaging and defect analysis of various materials. This can be attributed to HREM's ability to achieve results comparable to those obtained using structural models. The advent of advanced imaging techniques has also helped in narrowing the gap between modeled and measured results.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
EditorsG.W. Bailey, A.J. Garratt-Reed
Pages714-715
Number of pages2
StatePublished - 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Smith, D. (1994). Toward quantitative defect analysis using HREM. In G. W. Bailey, & A. J. Garratt-Reed (Eds.), Proceedings - Annual Meeting, Microscopy Society of America (pp. 714-715)