Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si02Si films: Investigation of the best experimental conditions with a conductive-atomic force microscope

R. Arinero, W. Hourani, A. D. Touboul, B. Gautier, M. Ramonda, D. Albertini, L. Militaru, Y. Gonzalez-Velo, C. Guasch, F. Saigné

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

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Physics & Astronomy