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Total Ionizing Dose Response of a 22-nm Compiled Fully Depleted Silicon-on-Insulator Static Random Access Memory
Lawrence T Clark, William E. Brown, Keith E. Holbert, A. Rao, P. Bikkina, Marek Turowski, Andrew Levy, T. Olvarez, Jim D. Butler, Clifford S. Youngsciortino, Steven M. Guertin
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations