Abstract

Nanoionic based resistive switching memory cells are nowadays being implemented in novel memory technology known as Conductive Bridging Random Access Memory. These memory cells, known as programmable metallization cells, are a promising memory technology not only due to their scaling potential but also because of characteristics such as non-volatility, low-power operation and speed. Resistance switching in programmable metallization cells is related to the growth and dissolution of conductive metallic filaments in solid electrolytes. In this work, the effect of total ionizing dose on the solid-state electrolyte obtained after photodoping of chalcogenide based programmable metallization is investigated. Equivalent circuits of devices are extracted from impedance spectroscopy measurements and used to gain insights on the effect of ionizing radiation on these materials and structures.

Original languageEnglish (US)
Title of host publication2014 IEEE Aerospace Conference
PublisherIEEE Computer Society
ISBN (Print)9781479916221
DOIs
StatePublished - Jan 1 2014
Event2014 IEEE Aerospace Conference - Big Sky, MT, United States
Duration: Mar 1 2014Mar 8 2014

Publication series

NameIEEE Aerospace Conference Proceedings
ISSN (Print)1095-323X

Other

Other2014 IEEE Aerospace Conference
CountryUnited States
CityBig Sky, MT
Period3/1/143/8/14

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ASJC Scopus subject areas

  • Aerospace Engineering
  • Space and Planetary Science

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