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Total-Ionizing-Dose Effects on Resistance Stability of Programmable Metallization Cell Based Memory and Selectors
W. Chen, R. Fang, Hugh Barnaby, M. B. Balaban, Yago Gonzalez Velo, J. L. Taggart, A. Mahmud, Keith Holbert, A. H. Edwards, Michael Kozicki
- Connection One (C1)
- Embedded Systems, Consortium for (CES)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Applied Nanoionics, Center for (CANi)
- Solid State Electronics Research Center (CSSER)
- Electrical Engineering
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Materials Science and Engineering
- Nano-Electronics, Arizona Institute of (AINE)
- Knowledge Enterprise (KE)
Research output: Contribution to journal › Article › peer-review
11
Scopus
citations