@inproceedings{1c262b4937724915b084871f36a21c8d,
title = "Total dose radiation effect simulations on a high-precision data acquisition system",
abstract = "A novel method to evaluate total dose radiation response on large mixed signal circuits is described. The method is based on partly behavioral, partly structural simulation on the VHDL-AMS language. Results obtained with the developed simulation method are compared to total dose testing results of an embedded high-precision data acquisition system. The system was total dose tested until functional failure in a Cobalt-60 irradiation chamber. Photoemission microscopy (PEM) analysis showed severe TID induced leakage currents inside the 1.2 kbyte SRAM memory sub-system. The SRAM sub-system was TID simulated with the developed method, and the results were compared to the irradiation test results. The simulation results suggest that the drain-to-source leakage currents inside the SRAM sub-system might not be the only cause for the system failure.",
keywords = "Behavioral modeling, CMOS, Mixed signal circuits, Radiation effects, Total ionizing dose (TID), VHDLAMS",
author = "Esko Mikkola and Bert Vermeire and Terence Chiu and Hugh Barnaby and Parks, {H. G.}",
year = "2007",
doi = "10.1109/RADECS.2007.5205496",
language = "English (US)",
isbn = "9781424417049",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
booktitle = "2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007",
note = "2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007 ; Conference date: 10-09-2007 Through 14-09-2007",
}