Time-resolved x-ray photoelectron spectroscopy techniques for real-time studies of interfacial charge transfer dynamics

Andrey Shavorskiy, Amy Cordones, Josh Vura-Weis, Katrin Siefermann, Daniel Slaughter, Felix Sturm, Fabian Weise, Hendrik Bluhm, Matthew Strader, Hana Cho, Ming Fu Lin, Camila Bacellar, Champak Khurmi, Marcus Hertlein, Jinghua Guo, Tolek Tyliszczak, David Prendergast, Giacomo Coslovich, Joseph Robinson, Robert A. KaindlRobert W. Schoenlein, Ali Belkacem, Thorsten Weber, Daniel M. Neumark, Stephen R. Leone, Dennis Nordlund, Hirohito Ogasawara, Anders R. Nilsson, Oleg Krupin, Joshua J. Turner, William F. Schlotter, Michael R. Holmes, Philip A. Heimann, Marc Messerschmidt, Michael P. Minitti, Martin Beye, Sheraz Gul, Jin Z. Zhang, Nils Huse, Oliver Gessner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

X-ray based spectroscopy techniques are particularly well suited to gain access to local oxidation states and electronic dynamics in complex systems with atomic pinpoint accuracy. Traditionally, these techniques are applied in a quasi-static fashion that usually highlights the steady-state properties of a system rather than the fast dynamics that often define the system function on a molecular level. Novel x-ray spectroscopy techniques enabled by free electron lasers (FELs) and synchrotron based pump-probe schemes provide the opportunity to monitor intramolecular and interfacial charge transfer processes in real-time and with element and chemical specificity. Two complementary time-domain xray photoelectron spectroscopy techniques are presented that are applied at the Linac Coherent Light Source (LCLS) and the Advanced Light Source (ALS) to study charge transfer processes in N3 dye-sensitized ZnO semiconductor nanocrystals, which are at the heart of emerging light-harvesting technologies.

Original languageEnglish (US)
Title of host publicationApplication of Accelerators in Research and Industry - Twenty-Second International Conference
Pages475-479
Number of pages5
DOIs
StatePublished - May 20 2013
Externally publishedYes
Event22nd International Conference on the Application of Accelerators in Research and Industry, CAARI 2012 - Fort Worth, TX, United States
Duration: Aug 5 2012Aug 10 2012

Publication series

NameAIP Conference Proceedings
Volume1525
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other22nd International Conference on the Application of Accelerators in Research and Industry, CAARI 2012
CountryUnited States
CityFort Worth, TX
Period8/5/128/10/12

Keywords

  • Dye-Sensitized Nanostructures
  • Free Electron Lasers
  • Ultrafast Spectroscopy
  • X-ray Photoelectron Spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Shavorskiy, A., Cordones, A., Vura-Weis, J., Siefermann, K., Slaughter, D., Sturm, F., Weise, F., Bluhm, H., Strader, M., Cho, H., Lin, M. F., Bacellar, C., Khurmi, C., Hertlein, M., Guo, J., Tyliszczak, T., Prendergast, D., Coslovich, G., Robinson, J., ... Gessner, O. (2013). Time-resolved x-ray photoelectron spectroscopy techniques for real-time studies of interfacial charge transfer dynamics. In Application of Accelerators in Research and Industry - Twenty-Second International Conference (pp. 475-479). (AIP Conference Proceedings; Vol. 1525). https://doi.org/10.1063/1.4802374