Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards?

Govindasamy Tamizhmani, S. Radhakrishnan, B. Shisler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

It is well recognized by the consumers and financial communities that the nameplate tolerance limit needs to be tightened. However, it is not known what is the practically acceptable lower limit to address the limitations of manufacturers, testing labs and standards developing communities. This paper aims to provide a data-driven objective evidence to support tightening the nameplate rating tolerance so the industry and standards developing organizations may consider requiring a lower nameplate tolerance. The independently measured Pmax data of thousands of modules, between 1997 and 2013, have been statistically analyzed to determine an acceptable lower limit for the nameplate tolerance. This extensive statistical analysis, based on the statistically significant number of modules, clearly indicates that the nameplate tolerance of less than 5% can easily be achieved by the manufacturers and is recommended to be included in the rating tolerance and pass/fail test standards.

Original languageEnglish (US)
Title of host publication2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3226-3229
Number of pages4
ISBN (Print)9781479943982
DOIs
StatePublished - Oct 15 2014
Externally publishedYes
Event40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States
Duration: Jun 8 2014Jun 13 2014

Other

Other40th IEEE Photovoltaic Specialist Conference, PVSC 2014
CountryUnited States
CityDenver
Period6/8/146/13/14

Fingerprint

Nameplates
Statistical methods
Testing

Keywords

  • EN 50380
  • IEC 61215
  • nameplate rating
  • tolerance
  • UL 4730

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Tamizhmani, G., Radhakrishnan, S., & Shisler, B. (2014). Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards? In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 3226-3229). [6925622] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2014.6925622

Tightening nameplate rating tolerance below 5% : Can it be rationally and objectively required in test standards? / Tamizhmani, Govindasamy; Radhakrishnan, S.; Shisler, B.

2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 3226-3229 6925622.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tamizhmani, G, Radhakrishnan, S & Shisler, B 2014, Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards? in 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014., 6925622, Institute of Electrical and Electronics Engineers Inc., pp. 3226-3229, 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, United States, 6/8/14. https://doi.org/10.1109/PVSC.2014.6925622
Tamizhmani G, Radhakrishnan S, Shisler B. Tightening nameplate rating tolerance below 5%: Can it be rationally and objectively required in test standards? In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 3226-3229. 6925622 https://doi.org/10.1109/PVSC.2014.6925622
Tamizhmani, Govindasamy ; Radhakrishnan, S. ; Shisler, B. / Tightening nameplate rating tolerance below 5% : Can it be rationally and objectively required in test standards?. 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 3226-3229
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