Tight bounds in message delays despite faults in a class of line digraph networks

Prashant D. Joshi; D. Frank Hsu; Arunabha Sen; Said Hamdioui; Koen Bertels

doi:10.1109/ISPAN-FCST-ISCC.2017.59

Tight bounds in message delays despite faults in a class of line digraph networks

Prashant D. Joshi, D. Frank Hsu, Arunabha Sen, Said Hamdioui, Koen Bertels

Engineering, Ira A. Fulton Schools of (IAFSE)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Communication networks must be designed to withstand failures. The robustness of a network needs to account for graceful performance degradation with multiple failures in the network. The traditional delay metric of the diameter of the network is insufficient in this regards to represent the message passing delay in the presence of faults. This paper explores the d-wide diameter of a class of regular extended line digraphs which bound the delays despite faults. By studying the container of the network's underlying graph, a measure of the distance between nodes through multiple node disjoint paths is obtained. This study shows that the class of networks designed by extended line digraphs has very tight upper bounds on the d-wide diameter and is just one more than the normal diameter. Thus despite d-1 node failures the worst case delay is just one more than that of the original network. This tight bound has very powerful uses in areas of enabling load balancing and bounded delays despite multiple network faults.

Original language	English (US)
Title of host publication	Proceedings - 14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	60-65
Number of pages	6
Volume	2017-November
ISBN (Electronic)	9781538608401
DOIs	https://doi.org/10.1109/ISPAN-FCST-ISCC.2017.59
State	Published - Nov 27 2017
Event	14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017 - Exeter, Devon, United Kingdom Duration: Jun 21 2017 → Jun 23 2017

Other

Other	14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017
Country/Territory	United Kingdom
City	Exeter, Devon
Period	6/21/17 → 6/23/17

Keywords

D-wide network diameter
Fault Tolerance
Graph containers
Line digraphs
Load balancing
Network diameter
Routing delays

ASJC Scopus subject areas

Industrial and Manufacturing Engineering
Control and Systems Engineering
Computer Science(all)
Electrical and Electronic Engineering

Access to Document

10.1109/ISPAN-FCST-ISCC.2017.59

Cite this

Joshi, P. D., Hsu, D. F., Sen, A., Hamdioui, S., & Bertels, K. (2017). Tight bounds in message delays despite faults in a class of line digraph networks. In Proceedings - 14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017 (Vol. 2017-November, pp. 60-65). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISPAN-FCST-ISCC.2017.59

Tight bounds in message delays despite faults in a class of line digraph networks. / Joshi, Prashant D.; Hsu, D. Frank; Sen, Arunabha et al.

Proceedings - 14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017. Vol. 2017-November Institute of Electrical and Electronics Engineers Inc., 2017. p. 60-65.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Joshi, PD, Hsu, DF, Sen, A, Hamdioui, S & Bertels, K 2017, Tight bounds in message delays despite faults in a class of line digraph networks. in Proceedings - 14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017. vol. 2017-November, Institute of Electrical and Electronics Engineers Inc., pp. 60-65, 14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017, Exeter, Devon, United Kingdom, 6/21/17. https://doi.org/10.1109/ISPAN-FCST-ISCC.2017.59

Joshi PD, Hsu DF, Sen A, Hamdioui S, Bertels K. Tight bounds in message delays despite faults in a class of line digraph networks. In Proceedings - 14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017. Vol. 2017-November. Institute of Electrical and Electronics Engineers Inc. 2017. p. 60-65 doi: 10.1109/ISPAN-FCST-ISCC.2017.59

Joshi, Prashant D. ; Hsu, D. Frank ; Sen, Arunabha et al. / Tight bounds in message delays despite faults in a class of line digraph networks. Proceedings - 14th International Symposium on Pervasive Systems, Algorithms and Networks, I-SPAN 2017, 11th International Conference on Frontier of Computer Science and Technology, FCST 2017 and 3rd International Symposium of Creative Computing, ISCC 2017. Vol. 2017-November Institute of Electrical and Electronics Engineers Inc., 2017. pp. 60-65

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AB - Communication networks must be designed to withstand failures. The robustness of a network needs to account for graceful performance degradation with multiple failures in the network. The traditional delay metric of the diameter of the network is insufficient in this regards to represent the message passing delay in the presence of faults. This paper explores the d-wide diameter of a class of regular extended line digraphs which bound the delays despite faults. By studying the container of the network's underlying graph, a measure of the distance between nodes through multiple node disjoint paths is obtained. This study shows that the class of networks designed by extended line digraphs has very tight upper bounds on the d-wide diameter and is just one more than the normal diameter. Thus despite d-1 node failures the worst case delay is just one more than that of the original network. This tight bound has very powerful uses in areas of enabling load balancing and bounded delays despite multiple network faults.

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Tight bounds in message delays despite faults in a class of line digraph networks

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