THz on-wafer calibration using offset-shorts and known through as standards

Cosan Caglayan, Georgios Trichopoulos, Kubilay Sertel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.

Original languageEnglish (US)
Title of host publicationNational Aerospace and Electronics Conference, Proceedings of the IEEE
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages308-309
Number of pages2
Volume2015-February
ISBN (Print)9781479946891
DOIs
StatePublished - Feb 19 2015
Externally publishedYes
EventIEEE National Aerospace and Electronics Conference, NAECON 2014 - Dayton, United States
Duration: Jun 24 2014Jun 27 2014

Other

OtherIEEE National Aerospace and Electronics Conference, NAECON 2014
CountryUnited States
CityDayton
Period6/24/146/27/14

Fingerprint

Calibration
Submillimeter waves
Millimeter waves

Keywords

  • millimeter waves
  • on-wafer measurements
  • sub-millimeter waves
  • terahertz

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Aerospace Engineering

Cite this

Caglayan, C., Trichopoulos, G., & Sertel, K. (2015). THz on-wafer calibration using offset-shorts and known through as standards. In National Aerospace and Electronics Conference, Proceedings of the IEEE (Vol. 2015-February, pp. 308-309). [7045823] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NAECON.2014.7045823

THz on-wafer calibration using offset-shorts and known through as standards. / Caglayan, Cosan; Trichopoulos, Georgios; Sertel, Kubilay.

National Aerospace and Electronics Conference, Proceedings of the IEEE. Vol. 2015-February Institute of Electrical and Electronics Engineers Inc., 2015. p. 308-309 7045823.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Caglayan, C, Trichopoulos, G & Sertel, K 2015, THz on-wafer calibration using offset-shorts and known through as standards. in National Aerospace and Electronics Conference, Proceedings of the IEEE. vol. 2015-February, 7045823, Institute of Electrical and Electronics Engineers Inc., pp. 308-309, IEEE National Aerospace and Electronics Conference, NAECON 2014, Dayton, United States, 6/24/14. https://doi.org/10.1109/NAECON.2014.7045823
Caglayan C, Trichopoulos G, Sertel K. THz on-wafer calibration using offset-shorts and known through as standards. In National Aerospace and Electronics Conference, Proceedings of the IEEE. Vol. 2015-February. Institute of Electrical and Electronics Engineers Inc. 2015. p. 308-309. 7045823 https://doi.org/10.1109/NAECON.2014.7045823
Caglayan, Cosan ; Trichopoulos, Georgios ; Sertel, Kubilay. / THz on-wafer calibration using offset-shorts and known through as standards. National Aerospace and Electronics Conference, Proceedings of the IEEE. Vol. 2015-February Institute of Electrical and Electronics Engineers Inc., 2015. pp. 308-309
@inproceedings{c589863ec9be4c68967545da0c58ffbe,
title = "THz on-wafer calibration using offset-shorts and known through as standards",
abstract = "We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.",
keywords = "millimeter waves, on-wafer measurements, sub-millimeter waves, terahertz",
author = "Cosan Caglayan and Georgios Trichopoulos and Kubilay Sertel",
year = "2015",
month = "2",
day = "19",
doi = "10.1109/NAECON.2014.7045823",
language = "English (US)",
isbn = "9781479946891",
volume = "2015-February",
pages = "308--309",
booktitle = "National Aerospace and Electronics Conference, Proceedings of the IEEE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - THz on-wafer calibration using offset-shorts and known through as standards

AU - Caglayan, Cosan

AU - Trichopoulos, Georgios

AU - Sertel, Kubilay

PY - 2015/2/19

Y1 - 2015/2/19

N2 - We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.

AB - We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.

KW - millimeter waves

KW - on-wafer measurements

KW - sub-millimeter waves

KW - terahertz

UR - http://www.scopus.com/inward/record.url?scp=84959362769&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84959362769&partnerID=8YFLogxK

U2 - 10.1109/NAECON.2014.7045823

DO - 10.1109/NAECON.2014.7045823

M3 - Conference contribution

AN - SCOPUS:84959362769

SN - 9781479946891

VL - 2015-February

SP - 308

EP - 309

BT - National Aerospace and Electronics Conference, Proceedings of the IEEE

PB - Institute of Electrical and Electronics Engineers Inc.

ER -