TY - GEN
T1 - THz on-wafer calibration using offset-shorts and known through as standards
AU - Caglayan, Cosan
AU - Trichopoulos, Georgios C.
AU - Sertel, Kubilay
PY - 2015/2/19
Y1 - 2015/2/19
N2 - We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.
AB - We present a novel on-wafer calibration technique using well-defined standards that can be an alternative to widely used multiline-TRL (thru-reflect-line) calibration in millimeter and submillimeter waves. Our method is specifically useful in measurement setups with fixed probes since TRL-type calibration typically requires different physical separation between measurement probes. As on-wafer standards, offset shorts with different electrical delay lengths and a simple through connection are used. Experimental validation of this calibration method is provided in G-Band (140-220 GHz) via measurement of a Beatty standard (mismatched thru) using non-contact probes.
KW - millimeter waves
KW - on-wafer measurements
KW - sub-millimeter waves
KW - terahertz
UR - http://www.scopus.com/inward/record.url?scp=84959362769&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84959362769&partnerID=8YFLogxK
U2 - 10.1109/NAECON.2014.7045823
DO - 10.1109/NAECON.2014.7045823
M3 - Conference contribution
AN - SCOPUS:84959362769
T3 - National Aerospace and Electronics Conference, Proceedings of the IEEE
SP - 308
EP - 309
BT - 2014 IEEE National Aerospace and Electronics Conference, NAECON 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE National Aerospace and Electronics Conference, NAECON 2014
Y2 - 24 June 2014 through 27 June 2014
ER -