Threshold voltage instability in a-Si: H TFTs and the implications for flexible displays and circuits

David Allee, S. M. Venugopal, R. Shringarpure, K. Kaftanoglu, S. G. Uppili, L. T. Clark, B. Vogt, E. J. Bawolek

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.

Original languageEnglish (US)
Title of host publicationProceedings of International Meeting on Information Display
Pages1297-1300
Number of pages4
Volume8
StatePublished - 2008
Event8th International Meeting on Information Display - International Display Manufacturing Conference 2008 and Asia Display 2008, IMID/IDMC/ASIA DISPLAY 2008 - Ilsan, Korea, Republic of
Duration: Oct 13 2008 → Oct 17 2008

Other

Other8th International Meeting on Information Display - International Display Manufacturing Conference 2008 and Asia Display 2008, IMID/IDMC/ASIA DISPLAY 2008
CountryKorea, Republic of
CityIlsan
Period10/13/08 → 10/17/08

Fingerprint

Flexible displays
Threshold voltage
Degradation
Networks (circuits)
Thin film transistors
Amorphous silicon
Temperature

Keywords

  • Amorphous silicon
  • Flexible display
  • TFT

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Allee, D., Venugopal, S. M., Shringarpure, R., Kaftanoglu, K., Uppili, S. G., Clark, L. T., ... Bawolek, E. J. (2008). Threshold voltage instability in a-Si: H TFTs and the implications for flexible displays and circuits. In Proceedings of International Meeting on Information Display (Vol. 8, pp. 1297-1300)

Threshold voltage instability in a-Si : H TFTs and the implications for flexible displays and circuits. / Allee, David; Venugopal, S. M.; Shringarpure, R.; Kaftanoglu, K.; Uppili, S. G.; Clark, L. T.; Vogt, B.; Bawolek, E. J.

Proceedings of International Meeting on Information Display. Vol. 8 2008. p. 1297-1300.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Allee, D, Venugopal, SM, Shringarpure, R, Kaftanoglu, K, Uppili, SG, Clark, LT, Vogt, B & Bawolek, EJ 2008, Threshold voltage instability in a-Si: H TFTs and the implications for flexible displays and circuits. in Proceedings of International Meeting on Information Display. vol. 8, pp. 1297-1300, 8th International Meeting on Information Display - International Display Manufacturing Conference 2008 and Asia Display 2008, IMID/IDMC/ASIA DISPLAY 2008, Ilsan, Korea, Republic of, 10/13/08.
Allee D, Venugopal SM, Shringarpure R, Kaftanoglu K, Uppili SG, Clark LT et al. Threshold voltage instability in a-Si: H TFTs and the implications for flexible displays and circuits. In Proceedings of International Meeting on Information Display. Vol. 8. 2008. p. 1297-1300
Allee, David ; Venugopal, S. M. ; Shringarpure, R. ; Kaftanoglu, K. ; Uppili, S. G. ; Clark, L. T. ; Vogt, B. ; Bawolek, E. J. / Threshold voltage instability in a-Si : H TFTs and the implications for flexible displays and circuits. Proceedings of International Meeting on Information Display. Vol. 8 2008. pp. 1297-1300
@inproceedings{81577e76027d4ff49fcc1a5fb338a9ca,
title = "Threshold voltage instability in a-Si: H TFTs and the implications for flexible displays and circuits",
abstract = "Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.",
keywords = "Amorphous silicon, Flexible display, TFT",
author = "David Allee and Venugopal, {S. M.} and R. Shringarpure and K. Kaftanoglu and Uppili, {S. G.} and Clark, {L. T.} and B. Vogt and Bawolek, {E. J.}",
year = "2008",
language = "English (US)",
volume = "8",
pages = "1297--1300",
booktitle = "Proceedings of International Meeting on Information Display",

}

TY - GEN

T1 - Threshold voltage instability in a-Si

T2 - H TFTs and the implications for flexible displays and circuits

AU - Allee, David

AU - Venugopal, S. M.

AU - Shringarpure, R.

AU - Kaftanoglu, K.

AU - Uppili, S. G.

AU - Clark, L. T.

AU - Vogt, B.

AU - Bawolek, E. J.

PY - 2008

Y1 - 2008

N2 - Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.

AB - Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.

KW - Amorphous silicon

KW - Flexible display

KW - TFT

UR - http://www.scopus.com/inward/record.url?scp=65649136194&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=65649136194&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:65649136194

VL - 8

SP - 1297

EP - 1300

BT - Proceedings of International Meeting on Information Display

ER -

Access to Document