Three-dimensional x-ray diffraction nanoscopy

Andrei Y. Nikulin; Ruben A. Dilanian; Nadia A. Zatsepin; Barry C. Muddle

doi:10.1117/12.795955

Three-dimensional x-ray diffraction nanoscopy

Andrei Y. Nikulin, Ruben A. Dilanian, Nadia A. Zatsepin, Barry C. Muddle

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

Original language	English (US)
Title of host publication	Instrumentation, Metrology, and Standards for Nanomanufacturing II
DOIs	https://doi.org/10.1117/12.795955
State	Published - 2008
Externally published	Yes
Event	Instrumentation, Metrology, and Standards for Nanomanufacturing II - San Diego, CA, United States Duration: Aug 10 2008 → Aug 10 2008

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	7042
ISSN (Print)	0277-786X

Other

Other	Instrumentation, Metrology, and Standards for Nanomanufacturing II
Country/Territory	United States
City	San Diego, CA
Period	8/10/08 → 8/10/08

Keywords

3D diffraction
Coherent x-rays
Imaging
Nano-structures
Phase-retrieval

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.795955

Cite this

Three-dimensional x-ray diffraction nanoscopy. / Nikulin, Andrei Y.; Dilanian, Ruben A.; Zatsepin, Nadia A. et al.
Instrumentation, Metrology, and Standards for Nanomanufacturing II. 2008. 70420H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7042).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Nikulin, AY, Dilanian, RA, Zatsepin, NA & Muddle, BC 2008, Three-dimensional x-ray diffraction nanoscopy. in Instrumentation, Metrology, and Standards for Nanomanufacturing II., 70420H, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II, San Diego, CA, United States, 8/10/08. https://doi.org/10.1117/12.795955

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AB - A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

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KW - Coherent x-rays

KW - Imaging

KW - Nano-structures

KW - Phase-retrieval

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Three-dimensional x-ray diffraction nanoscopy

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

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