Three-dimensional x-ray diffraction nanoscopy

Andrei Y. Nikulin, Ruben A. Dilanian, Nadia A. Zatsepin, Barry C. Muddle

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

Original languageEnglish (US)
Title of host publicationInstrumentation, Metrology, and Standards for Nanomanufacturing II
DOIs
StatePublished - Nov 21 2008
EventInstrumentation, Metrology, and Standards for Nanomanufacturing II - San Diego, CA, United States
Duration: Aug 10 2008Aug 10 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7042
ISSN (Print)0277-786X

Other

OtherInstrumentation, Metrology, and Standards for Nanomanufacturing II
CountryUnited States
CitySan Diego, CA
Period8/10/088/10/08

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Keywords

  • 3D diffraction
  • Coherent x-rays
  • Imaging
  • Nano-structures
  • Phase-retrieval

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Nikulin, A. Y., Dilanian, R. A., Zatsepin, N. A., & Muddle, B. C. (2008). Three-dimensional x-ray diffraction nanoscopy. In Instrumentation, Metrology, and Standards for Nanomanufacturing II [70420H] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7042). https://doi.org/10.1117/12.795955