Three-dimensional x-ray diffraction nanoscopy

Andrei Y. Nikulin, Ruben A. Dilanian, Nadia Zatsepin, Barry C. Muddle

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

Original languageEnglish (US)
Title of host publicationInstrumentation, Metrology, and Standards for Nanomanufacturing II
Volume7042
DOIs
StatePublished - Nov 21 2008
Externally publishedYes
EventInstrumentation, Metrology, and Standards for Nanomanufacturing II - San Diego, CA, United States
Duration: Aug 10 2008Aug 10 2008

Other

OtherInstrumentation, Metrology, and Standards for Nanomanufacturing II
CountryUnited States
CitySan Diego, CA
Period8/10/088/10/08

Fingerprint

3D Reconstruction
Nanostructures
X-ray Diffraction
Spatial Resolution
Rendering
Three-dimension
Data analysis
x ray diffraction
Diffraction
spatial resolution
Composite
Synthesis
X rays
Three-dimensional
composite materials
synthesis
x rays
Composite materials

Keywords

  • 3D diffraction
  • Coherent x-rays
  • Imaging
  • Nano-structures
  • Phase-retrieval

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Nikulin, A. Y., Dilanian, R. A., Zatsepin, N., & Muddle, B. C. (2008). Three-dimensional x-ray diffraction nanoscopy. In Instrumentation, Metrology, and Standards for Nanomanufacturing II (Vol. 7042). [70420H] https://doi.org/10.1117/12.795955

Three-dimensional x-ray diffraction nanoscopy. / Nikulin, Andrei Y.; Dilanian, Ruben A.; Zatsepin, Nadia; Muddle, Barry C.

Instrumentation, Metrology, and Standards for Nanomanufacturing II. Vol. 7042 2008. 70420H.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nikulin, AY, Dilanian, RA, Zatsepin, N & Muddle, BC 2008, Three-dimensional x-ray diffraction nanoscopy. in Instrumentation, Metrology, and Standards for Nanomanufacturing II. vol. 7042, 70420H, Instrumentation, Metrology, and Standards for Nanomanufacturing II, San Diego, CA, United States, 8/10/08. https://doi.org/10.1117/12.795955
Nikulin AY, Dilanian RA, Zatsepin N, Muddle BC. Three-dimensional x-ray diffraction nanoscopy. In Instrumentation, Metrology, and Standards for Nanomanufacturing II. Vol. 7042. 2008. 70420H https://doi.org/10.1117/12.795955
Nikulin, Andrei Y. ; Dilanian, Ruben A. ; Zatsepin, Nadia ; Muddle, Barry C. / Three-dimensional x-ray diffraction nanoscopy. Instrumentation, Metrology, and Standards for Nanomanufacturing II. Vol. 7042 2008.
@inproceedings{13f67cd6f09e4ecea01a922f15c12608,
title = "Three-dimensional x-ray diffraction nanoscopy",
abstract = "A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.",
keywords = "3D diffraction, Coherent x-rays, Imaging, Nano-structures, Phase-retrieval",
author = "Nikulin, {Andrei Y.} and Dilanian, {Ruben A.} and Nadia Zatsepin and Muddle, {Barry C.}",
year = "2008",
month = "11",
day = "21",
doi = "10.1117/12.795955",
language = "English (US)",
isbn = "9780819472625",
volume = "7042",
booktitle = "Instrumentation, Metrology, and Standards for Nanomanufacturing II",

}

TY - GEN

T1 - Three-dimensional x-ray diffraction nanoscopy

AU - Nikulin, Andrei Y.

AU - Dilanian, Ruben A.

AU - Zatsepin, Nadia

AU - Muddle, Barry C.

PY - 2008/11/21

Y1 - 2008/11/21

N2 - A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

AB - A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

KW - 3D diffraction

KW - Coherent x-rays

KW - Imaging

KW - Nano-structures

KW - Phase-retrieval

UR - http://www.scopus.com/inward/record.url?scp=56249092108&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=56249092108&partnerID=8YFLogxK

U2 - 10.1117/12.795955

DO - 10.1117/12.795955

M3 - Conference contribution

SN - 9780819472625

VL - 7042

BT - Instrumentation, Metrology, and Standards for Nanomanufacturing II

ER -