Three-dimensional arrangement of rare-earth atoms at grain boundaries in silicon nitride ceramics using aberration-corrected HAADF-STEM

G. B. Winkelman; C. Dwyer; T. S. Hudson; D. Nguyen-Manh; M. D. Blinger; R. L. Satet; M. J. Hoffmann; D. J.H. Cockayne

doi:10.1017/S1341927605503702

Three-dimensional arrangement of rare-earth atoms at grain boundaries in silicon nitride ceramics using aberration-corrected HAADF-STEM

G. B. Winkelman, C. Dwyer, T. S. Hudson, D. Nguyen-Manh, M. D. Blinger, R. L. Satet, M. J. Hoffmann, D. J.H. Cockayne

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	206-207
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	11
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1341927605503702
State	Published - Aug 25 2005
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1017/S1341927605503702

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@article{abe9f0afcd2f4465bacf83f7fb177394,

title = "Three-dimensional arrangement of rare-earth atoms at grain boundaries in silicon nitride ceramics using aberration-corrected HAADF-STEM",

author = "Winkelman, {G. B.} and C. Dwyer and Hudson, {T. S.} and D. Nguyen-Manh and Blinger, {M. D.} and Satet, {R. L.} and Hoffmann, {M. J.} and Cockayne, {D. J.H.}",

year = "2005",

month = aug,

day = "25",

doi = "10.1017/S1341927605503702",

language = "English (US)",

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pages = "206--207",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

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TY - JOUR

T1 - Three-dimensional arrangement of rare-earth atoms at grain boundaries in silicon nitride ceramics using aberration-corrected HAADF-STEM

AU - Winkelman, G. B.

AU - Dwyer, C.

AU - Hudson, T. S.

AU - Nguyen-Manh, D.

AU - Blinger, M. D.

AU - Satet, R. L.

AU - Hoffmann, M. J.

AU - Cockayne, D. J.H.

PY - 2005/8/25

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U2 - 10.1017/S1341927605503702

DO - 10.1017/S1341927605503702

M3 - Article

AN - SCOPUS:23844525160

SN - 1431-9276

VL - 11

SP - 206

EP - 207

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Three-dimensional arrangement of rare-earth atoms at grain boundaries in silicon nitride ceramics using aberration-corrected HAADF-STEM

ASJC Scopus subject areas

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