Three dimensional (3D) visualization of damage in metal-ceramic nanolayers by focused ion beam (FIB) serial sectioning

Nikhilesh Chawla, D. R P Singh

Research output: Contribution to journalArticle

4 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)140-141
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2008

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Cermets
Focused ion beams
Visualization
ion beams
ceramics
damage
metals

ASJC Scopus subject areas

  • Instrumentation

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Three dimensional (3D) visualization of damage in metal-ceramic nanolayers by focused ion beam (FIB) serial sectioning. / Chawla, Nikhilesh; Singh, D. R P.

In: Microscopy and Microanalysis, Vol. 14, No. SUPPL. 2, 08.2008, p. 140-141.

Research output: Contribution to journalArticle

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