THICKNESS FRINGE CONTRAST AT GRAIN BOUNDARIES IN TEM AND STEM: COMPARISON WITH TOP-BOTTOM EFFECT.

J. Bentley, M. J. Goringe, R. W. Carpenter

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

The article reports detailed experimental observations by TEM and STEM of fringe contrast on inclined grain boundaries that show the effect noted above to be the same for either TEM or STEM images taken under reasonably similar diffracting conditions, and quite different from the classical top-bottom effect. Dynamical calculations show the observed image degradation to be a result of the absorption (inelastic scattering).

Original languageEnglish (US)
Pages (from-to)153-158
Number of pages6
JournalScanning Electron Microscopy
StatePublished - Jan 1 1981

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Biophysics

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