Abstract
Imaging of field emission and photoemission from diamond surfaces is accomplished with a high resolution photo-electron emission microscope (PEEM). Measurements obtained as a function of sample temperature up to 1000°C display thermionic field emission images (T-FEEM). The system can also record the emission current versus applied voltage. N-doped diamond films have been produced by MPCVD with a N/C gas phase ratio of 48. The surfaces display uniform emission in PEEM at all temperatures. No FEEM images are detectable below 500°C. At ∼680°C the T-FEEM and PEEM images are nearly identical in intensity and uniformity. This is to be contrasted with other carbon based cold cathodes in which the emission is observed from only a low density of highly emitting sites. The I/V measurements obtained from the N-doped films in the T-FEEM configuration show a component that depends linearly on voltage at low fields. At higher fields, an approximately exponential dependence is observed. At low temperatures employed (<700°C), the results indicate a thermionic component to the emitted current.
Original language | English (US) |
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Title of host publication | Materials Research Society Symposium - Proceedings |
Editors | K.L. Jensen, R.J. Nemanich, P. Holloway, T. Trottier, W. Mackie |
Volume | 621 |
State | Published - 2000 |
Externally published | Yes |
Event | Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays - San Francisco, CA, United States Duration: Apr 25 2000 → Apr 27 2000 |
Other
Other | Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays |
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Country/Territory | United States |
City | San Francisco, CA |
Period | 4/25/00 → 4/27/00 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials