Abstract
The temperature dependence of the lattice parameter of Ge1-y Sny alloys deposited on Si substrates has been determined from an analysis of their x-ray reciprocal-space maps. It is found that over the range 0<y<0.03 the alloy thermal expansivity increases by up to 20% as a function of y. This implies a strong deviation from a linear interpolation between the end compounds since the thermal expansivities of pure Ge and α-Sn are nearly the same. Alternative interpolation formulas based on a Debye model and a mixed Debye-Einstein model of the phonon structure are tested and it is found that they also fail to explain the observed increase in thermal expansivity.
Original language | English (US) |
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Article number | 245214 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 81 |
Issue number | 24 |
DOIs | |
State | Published - Jun 29 2010 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics