Abstract

In this paper we summarize our research work on electro-thermal modeling of different generations of fully-depleted SOI devices. We first discuss our electro-thermal device simulator that self-consistently couples the Monte Carlo solver for the electrons with the energy balance solver for acoustic and optical phonons. Afterwards we discuss simulation results for different technology fully-depleted SOI devices.

Original languageEnglish (US)
Title of host publicationECS Transactions
Pages337-344
Number of pages8
Volume23
Edition1
DOIs
StatePublished - 2009
Event24th International Symposium on Microelectronics Technology and Devices - SBMicro 2009 - Natal, Brazil
Duration: Aug 31 2009Sep 3 2009

Other

Other24th International Symposium on Microelectronics Technology and Devices - SBMicro 2009
CountryBrazil
CityNatal
Period8/31/099/3/09

Fingerprint

Thermal effects
Phonons
Energy balance
Simulators
Acoustics
Electrons
Hot Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Vasileska, D., Raleva, K., & Goodnick, S. (2009). Thermal effects in fully-depleted SOI devices. In ECS Transactions (1 ed., Vol. 23, pp. 337-344) https://doi.org/10.1149/13183737

Thermal effects in fully-depleted SOI devices. / Vasileska, Dragica; Raleva, K.; Goodnick, Stephen.

ECS Transactions. Vol. 23 1. ed. 2009. p. 337-344.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vasileska, D, Raleva, K & Goodnick, S 2009, Thermal effects in fully-depleted SOI devices. in ECS Transactions. 1 edn, vol. 23, pp. 337-344, 24th International Symposium on Microelectronics Technology and Devices - SBMicro 2009, Natal, Brazil, 8/31/09. https://doi.org/10.1149/13183737
Vasileska D, Raleva K, Goodnick S. Thermal effects in fully-depleted SOI devices. In ECS Transactions. 1 ed. Vol. 23. 2009. p. 337-344 https://doi.org/10.1149/13183737
Vasileska, Dragica ; Raleva, K. ; Goodnick, Stephen. / Thermal effects in fully-depleted SOI devices. ECS Transactions. Vol. 23 1. ed. 2009. pp. 337-344
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