Thermal detection of single e-h pairs in a biased silicon crystal detector

R. K. Romani, P. L. Brink, B. Cabrera, M. Cherry, T. Howarth, N. Kurinsky, R. A. Moffatt, R. Partridge, Fernando Ponce, M. Pyle, A. Tomada, S. Yellin, J. J. Yen, B. A. Young

Research output: Contribution to journalArticle

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Abstract

We demonstrate that individual electron-hole pairs are resolved in a 1 cm2 by 4 mm thick silicon crystal (0.93 g) operated at ∼35 mK. One side of the detector is patterned with two quasiparticle-trap-assisted electro-thermal-feedback transition edge sensor arrays held near ground potential. The other side contains a bias grid with 20% coverage. Bias potentials up to ±160 V were used in the work reported here. A fiber optic provides 650 nm (1.9 eV) photons that each produce an electron-hole (e- h+) pair in the crystal near the grid. The energy of the drifting charges is measured with a phonon sensor noise σ ∼0.09 e- h+ pair. The observed charge quantization is nearly identical for h+s or e-s transported across the crystal.

Original languageEnglish (US)
Article number043501
JournalApplied Physics Letters
Volume112
Issue number4
DOIs
StatePublished - Jan 22 2018
Externally publishedYes

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detectors
silicon
grids
crystals
sensors
fiber optics
traps
photons
energy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Romani, R. K., Brink, P. L., Cabrera, B., Cherry, M., Howarth, T., Kurinsky, N., ... Young, B. A. (2018). Thermal detection of single e-h pairs in a biased silicon crystal detector. Applied Physics Letters, 112(4), [043501]. https://doi.org/10.1063/1.5010699

Thermal detection of single e-h pairs in a biased silicon crystal detector. / Romani, R. K.; Brink, P. L.; Cabrera, B.; Cherry, M.; Howarth, T.; Kurinsky, N.; Moffatt, R. A.; Partridge, R.; Ponce, Fernando; Pyle, M.; Tomada, A.; Yellin, S.; Yen, J. J.; Young, B. A.

In: Applied Physics Letters, Vol. 112, No. 4, 043501, 22.01.2018.

Research output: Contribution to journalArticle

Romani, RK, Brink, PL, Cabrera, B, Cherry, M, Howarth, T, Kurinsky, N, Moffatt, RA, Partridge, R, Ponce, F, Pyle, M, Tomada, A, Yellin, S, Yen, JJ & Young, BA 2018, 'Thermal detection of single e-h pairs in a biased silicon crystal detector', Applied Physics Letters, vol. 112, no. 4, 043501. https://doi.org/10.1063/1.5010699
Romani RK, Brink PL, Cabrera B, Cherry M, Howarth T, Kurinsky N et al. Thermal detection of single e-h pairs in a biased silicon crystal detector. Applied Physics Letters. 2018 Jan 22;112(4). 043501. https://doi.org/10.1063/1.5010699
Romani, R. K. ; Brink, P. L. ; Cabrera, B. ; Cherry, M. ; Howarth, T. ; Kurinsky, N. ; Moffatt, R. A. ; Partridge, R. ; Ponce, Fernando ; Pyle, M. ; Tomada, A. ; Yellin, S. ; Yen, J. J. ; Young, B. A. / Thermal detection of single e-h pairs in a biased silicon crystal detector. In: Applied Physics Letters. 2018 ; Vol. 112, No. 4.
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