The versatile FEG-SEM: From ultra-high resolution to ultra-high surface sensitivity

Research output: Contribution to journalArticle

4 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)144-145
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
StatePublished - 2003
Externally publishedYes

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Scanning electron microscopy
scanning electron microscopy
high resolution

ASJC Scopus subject areas

  • Instrumentation

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The versatile FEG-SEM : From ultra-high resolution to ultra-high surface sensitivity. / Liu, Jingyue.

In: Microscopy and Microanalysis, Vol. 9, No. SUPPL. 2, 2003, p. 144-145.

Research output: Contribution to journalArticle

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