The use of a dose-rate switching technique to characterize bipolar devices

Jérôme Boch, Yago Gonzalez Velo, Frédéric Saigné, Nicolas J.H. Roche, Ronald D. Schrimpf, Jean Roch Vaillé, Laurent Dusseau, Christian Chatry, Eric Lorfèvre, Robert Ecoffet, Antoine D. Touboul

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

The enhanced radiation sensitivity exhibited at low dose rate by many bipolar devices remains one of the main concerns for spacecraft reliability. As an accelerated test technique, a new approach based on dose-rate switching experiments has been proposed to characterize bipolar devices. The foundations of this approach are detailed and guidelines for its use are given.

Original languageEnglish (US)
Article number5341412
Pages (from-to)3347-3353
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume56
Issue number6
DOIs
StatePublished - Dec 1 2009
Externally publishedYes

Fingerprint

spacecraft reliability
Dosimetry
Spacecraft
Radiation
dosage
Experiments
radiation

Keywords

  • Accelerated test method
  • Dose rate
  • Integrated circuits
  • Switching experiments
  • Total dose

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

Cite this

Boch, J., Gonzalez Velo, Y., Saigné, F., Roche, N. J. H., Schrimpf, R. D., Vaillé, J. R., ... Touboul, A. D. (2009). The use of a dose-rate switching technique to characterize bipolar devices. IEEE Transactions on Nuclear Science, 56(6), 3347-3353. [5341412]. https://doi.org/10.1109/TNS.2009.2033686

The use of a dose-rate switching technique to characterize bipolar devices. / Boch, Jérôme; Gonzalez Velo, Yago; Saigné, Frédéric; Roche, Nicolas J.H.; Schrimpf, Ronald D.; Vaillé, Jean Roch; Dusseau, Laurent; Chatry, Christian; Lorfèvre, Eric; Ecoffet, Robert; Touboul, Antoine D.

In: IEEE Transactions on Nuclear Science, Vol. 56, No. 6, 5341412, 01.12.2009, p. 3347-3353.

Research output: Contribution to journalArticle

Boch, J, Gonzalez Velo, Y, Saigné, F, Roche, NJH, Schrimpf, RD, Vaillé, JR, Dusseau, L, Chatry, C, Lorfèvre, E, Ecoffet, R & Touboul, AD 2009, 'The use of a dose-rate switching technique to characterize bipolar devices', IEEE Transactions on Nuclear Science, vol. 56, no. 6, 5341412, pp. 3347-3353. https://doi.org/10.1109/TNS.2009.2033686
Boch, Jérôme ; Gonzalez Velo, Yago ; Saigné, Frédéric ; Roche, Nicolas J.H. ; Schrimpf, Ronald D. ; Vaillé, Jean Roch ; Dusseau, Laurent ; Chatry, Christian ; Lorfèvre, Eric ; Ecoffet, Robert ; Touboul, Antoine D. / The use of a dose-rate switching technique to characterize bipolar devices. In: IEEE Transactions on Nuclear Science. 2009 ; Vol. 56, No. 6. pp. 3347-3353.
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