The TolTEC camera: An overview of the instrument and in-lab testing results

Grant W. Wilson, Sophia Abi-Saad, Peter Ade, Itziar Aretxaga, Jason Austermann, Yvonne Ban, Joseph Bardin, James Beall, Marc Berthoud, Sean Bryan, John Bussan, Edgar Castillo, Miguel Chavez, Reid Contente, N. S. Denigris, Bradley Dober, Miranda Eiben, Daniel Ferrusca, Laura Fissel, Jiansong GaoJoseph E. Golec, Robert Golina, Arturo Gomez, Sam Gordon, Robert Gutermuth, Gene Hilton, Mohsen Hosseini, Johannes Hubmayr, David Hughes, Stephen Kuczarski, Dennis Lee, Emily Lunde, Zhiyuan Ma, Hamdi Mani, Philip Mauskopf, Michael McCrackan, Christopher McKenney, Jeffrey McMahon, Giles Novak, Giampaolo Pisano, Alexandra Pope, Amy Ralston, Ivan Rodriguez, David Sanchez-Argüelles, F. Peter Schloerb, Sara Simon, Adrian Sinclair, Kamal Souccar, Ana Torres Campos, Carole Tucker, Joel Ullom, Eric Van Camp, Jeff Van Lanen, Miguel Velazquez, Michael Vissers, Eric Weeks, Min S. Yun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

TolTEC is a three-band imaging polarimeter for the Large Millimeter Telescope. Simultaneously observing with passbands at 1.1mm, 1.4mm and 2.0mm, TolTEC has diffraction-limited beams with FWHM of 5, 7, and 11 arcsec, respectively. Over the coming decade, TolTEC will perform a combination of PI-led and Open-Access Legacy Survey projects. Herein we provide an overview of the instrument and give the first quantitative measures of its performance in the lab prior to shipping to the telescope in 2021.

Original languageEnglish (US)
Title of host publicationMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X
EditorsJonas Zmuidzinas, Jian-Rong Gao
PublisherSPIE
ISBN (Electronic)9781510636934
DOIs
StatePublished - 2020
Externally publishedYes
EventMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X 2020 - Virtual, Online, United States
Duration: Dec 14 2020Dec 22 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11453
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X 2020
Country/TerritoryUnited States
CityVirtual, Online
Period12/14/2012/22/20

Keywords

  • Large Millimeter Telescope
  • camera
  • kinetic inductance detector
  • mm-wavelength

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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