The theory and interpretation of electron energy loss near-edge fine structure

Peter Rez, David A. Muller

Research output: Chapter in Book/Report/Conference proceedingChapter

40 Scopus citations

Abstract

Electron energy loss fine structure near the threshold of inner-shell edges can potentially give valuable information on bonding on an atomic scale. To use near-edge structure it is essential to understand what factors influence both the occupied and unoccupied local density of states in the material of interest. Different techniques of electronic structure theory are suitable for metals, semiconductors, and ionic materials, although some methods can be applied to a wide range of systems. To extract quantitative information on bonding it is important to avoid those edges that are strongly affected by the presence of the core hole such as cations in ionic materials.

Original languageEnglish (US)
Title of host publicationAnnual Review of Materials Research
EditorsDavid Clarke, Manfred Ruehle, Antoni Tomsia
Pages535-558
Number of pages24
DOIs
StatePublished - Sep 1 2008

Publication series

NameAnnual Review of Materials Research
Volume38
ISSN (Print)1531-7331

Keywords

  • Electron microscope
  • Inner shell
  • X-ray absorption

ASJC Scopus subject areas

  • Materials Science(all)

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