The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier

Fabien Roig; L. Dusseau; P. Ribeiro; G. Auriel; N. J.H. Roche; A. Privat; J. R. Vaille; J. Boch; F. Saigne; R. Marec; P. Calvel; F. Bezerra; R. Ecoffet; B. Azais

doi:10.1109/TNS.2014.2369347

The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier

Fabien Roig, L. Dusseau, P. Ribeiro, G. Auriel, N. J.H. Roche, A. Privat, J. R. Vaille, J. Boch, F. Saigne, R. Marec, P. Calvel, F. Bezerra, R. Ecoffet, B. Azais

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

The influence of external circuit designs on ASET shapes in a high speed current feedback amplifier (CFA) (AD844) is investigated by means of the pulsed laser single event effect (PLSEE) simulation technique. Changes of the feedback resistors modify circuit's electrical parameters such as closed-loop gain and bandwidth, affecting amplifier stability and so ASET shapes. Qualitative explanations based on general electronic rules and feedback theories enable the understanding of a CFA operation establishing a correlation between the evolution of external feedback resistor values and ASET parameters. TID effects on the ASET sensitivity in AD844 CFA are also investigated in this work highlighting different behaviors according to the impacted bipolar transistor in the integrated circuit.

Original language	English (US)
Article number	6969838
Pages (from-to)	3201-3209
Number of pages	9
Journal	IEEE Transactions on Nuclear Science
Volume	61
Issue number	6
DOIs	https://doi.org/10.1109/TNS.2014.2369347
State	Published - Dec 1 2014
Externally published	Yes

Keywords

Bipolar analog integrated circuits
ionizing dose
single event transient
transient analysis
transient response

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2014.2369347

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Roig, F., Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J. H., Privat, A., Vaille, J. R., Boch, J., Saigne, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., & Azais, B. (2014). The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier. IEEE Transactions on Nuclear Science, 61(6), 3201-3209. Article 6969838. https://doi.org/10.1109/TNS.2014.2369347

Roig, F, Dusseau, L, Ribeiro, P, Auriel, G, Roche, NJH, Privat, A, Vaille, JR, Boch, J, Saigne, F, Marec, R, Calvel, P, Bezerra, F, Ecoffet, R & Azais, B 2014, 'The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier', IEEE Transactions on Nuclear Science, vol. 61, no. 6, 6969838, pp. 3201-3209. https://doi.org/10.1109/TNS.2014.2369347

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abstract = "The influence of external circuit designs on ASET shapes in a high speed current feedback amplifier (CFA) (AD844) is investigated by means of the pulsed laser single event effect (PLSEE) simulation technique. Changes of the feedback resistors modify circuit's electrical parameters such as closed-loop gain and bandwidth, affecting amplifier stability and so ASET shapes. Qualitative explanations based on general electronic rules and feedback theories enable the understanding of a CFA operation establishing a correlation between the evolution of external feedback resistor values and ASET parameters. TID effects on the ASET sensitivity in AD844 CFA are also investigated in this work highlighting different behaviors according to the impacted bipolar transistor in the integrated circuit.",

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AU - Auriel, G.

AU - Roche, N. J.H.

AU - Privat, A.

AU - Vaille, J. R.

AU - Boch, J.

AU - Saigne, F.

AU - Marec, R.

AU - Calvel, P.

AU - Bezerra, F.

AU - Ecoffet, R.

AU - Azais, B.

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AB - The influence of external circuit designs on ASET shapes in a high speed current feedback amplifier (CFA) (AD844) is investigated by means of the pulsed laser single event effect (PLSEE) simulation technique. Changes of the feedback resistors modify circuit's electrical parameters such as closed-loop gain and bandwidth, affecting amplifier stability and so ASET shapes. Qualitative explanations based on general electronic rules and feedback theories enable the understanding of a CFA operation establishing a correlation between the evolution of external feedback resistor values and ASET parameters. TID effects on the ASET sensitivity in AD844 CFA are also investigated in this work highlighting different behaviors according to the impacted bipolar transistor in the integrated circuit.

KW - Bipolar analog integrated circuits

KW - ionizing dose

KW - single event transient

KW - transient analysis

KW - transient response

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The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier

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