The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier

Fabien Roig, L. Dusseau, P. Ribeiro, G. Auriel, N. J.H. Roche, A. Privat, J. R. Vaille, J. Boch, F. Saigne, R. Marec, P. Calvel, F. Bezerra, R. Ecoffet, B. Azais

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

The influence of external circuit designs on ASET shapes in a high speed current feedback amplifier (CFA) (AD844) is investigated by means of the pulsed laser single event effect (PLSEE) simulation technique. Changes of the feedback resistors modify circuit's electrical parameters such as closed-loop gain and bandwidth, affecting amplifier stability and so ASET shapes. Qualitative explanations based on general electronic rules and feedback theories enable the understanding of a CFA operation establishing a correlation between the evolution of external feedback resistor values and ASET parameters. TID effects on the ASET sensitivity in AD844 CFA are also investigated in this work highlighting different behaviors according to the impacted bipolar transistor in the integrated circuit.

Original languageEnglish (US)
Article number6969838
Pages (from-to)3201-3209
Number of pages9
JournalIEEE Transactions on Nuclear Science
Volume61
Issue number6
DOIs
StatePublished - Dec 1 2014
Externally publishedYes

Keywords

  • Bipolar analog integrated circuits
  • ionizing dose
  • single event transient
  • transient analysis
  • transient response

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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