The real-time growth of atom planes on Ru, Rh and Sn microcrystals observed at atomic resolution

J. O. Malm, J. O. Bovin, Amanda K. Petford-Long, David Smith

Research output: Contribution to journalArticle

12 Scopus citations


The growth of small Ru, Rh and Sn crystals, atomic column by atomic column, has been recorded in real time using a 400 kV high-resolution electron microscope, operated in the surface profile imaging mode. A common observation preceding the addition of a new atomic plane on the surface of the small (2-4 nm) metal crystal was the occurence of a diffuse "cloud". Moreover, the sequential growth of an atomic plane was often preceded by the presence of such a cloud at the growth front (especially for Ru and Rh). Real-time video sequences showed that the addition of a new atomic layer typically took about 1 min.

Original languageEnglish (US)
Pages (from-to)165-170
Number of pages6
JournalJournal of Crystal Growth
Issue number2-3
StatePublished - Jun 2 1988


ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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