The measurement of transistor characteristics using on-chip switching for the connection of instrumentation

D. Ward, A. J. Walton, J. M. Robertson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper investigates the feasibility of using on-chip switching for the instrumentation used to measure transistor characteristics. The effect of the switching transistors on the measurements are evaluated by comparing the SPICE parameters extracted from measurements made via the switching transistors with those derived directly. It is shown lthat accurate SPICE parameters can be extracted from process control chips with on-chip switching.

Original languageEnglish (US)
Title of host publicationESSDERC 1987 - 17th European Solid State Device Research Conference
PublisherIEEE Computer Society
Pages919-922
Number of pages4
ISBN (Electronic)0444704779
ISBN (Print)9780444704771
StatePublished - Jan 1 1987
Event17th European Solid State Device Research Conference, ESSDERC 1987 - Bologna, Italy
Duration: Sep 14 1987Sep 17 1987

Publication series

NameEuropean Solid-State Device Research Conference
ISSN (Print)1930-8876

Other

Other17th European Solid State Device Research Conference, ESSDERC 1987
CountryItaly
CityBologna
Period9/14/879/17/87

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Ward, D., Walton, A. J., & Robertson, J. M. (1987). The measurement of transistor characteristics using on-chip switching for the connection of instrumentation. In ESSDERC 1987 - 17th European Solid State Device Research Conference (pp. 919-922). [5436776] (European Solid-State Device Research Conference). IEEE Computer Society.