The measurement of transistor characteristics using on-chip switching for the connection of instrumentation

D. Ward, A. J. Walton, J. M. Robertson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper investigates the feasibility of using on-chip switching for the instrumentation used to measure transistor characteristics. The effect of the switching transistors on the measurements are evaluated by comparing the SPICE parameters extracted from measurements made via the switching transistors with those derived directly. It is shown lthat accurate SPICE parameters can be extracted from process control chips with on-chip switching.

Original languageEnglish (US)
Title of host publicationEuropean Solid-State Device Research Conference
PublisherIEEE Computer Society
Pages919-922
Number of pages4
ISBN (Print)0444704779, 9780444704771
StatePublished - 1987
Externally publishedYes
Event17th European Solid State Device Research Conference, ESSDERC 1987 - Bologna, Italy
Duration: Sep 14 1987Sep 17 1987

Other

Other17th European Solid State Device Research Conference, ESSDERC 1987
CountryItaly
CityBologna
Period9/14/879/17/87

Fingerprint

Transistors
SPICE
Process control

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Ward, D., Walton, A. J., & Robertson, J. M. (1987). The measurement of transistor characteristics using on-chip switching for the connection of instrumentation. In European Solid-State Device Research Conference (pp. 919-922). [5436776] IEEE Computer Society.

The measurement of transistor characteristics using on-chip switching for the connection of instrumentation. / Ward, D.; Walton, A. J.; Robertson, J. M.

European Solid-State Device Research Conference. IEEE Computer Society, 1987. p. 919-922 5436776.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ward, D, Walton, AJ & Robertson, JM 1987, The measurement of transistor characteristics using on-chip switching for the connection of instrumentation. in European Solid-State Device Research Conference., 5436776, IEEE Computer Society, pp. 919-922, 17th European Solid State Device Research Conference, ESSDERC 1987, Bologna, Italy, 9/14/87.
Ward D, Walton AJ, Robertson JM. The measurement of transistor characteristics using on-chip switching for the connection of instrumentation. In European Solid-State Device Research Conference. IEEE Computer Society. 1987. p. 919-922. 5436776
Ward, D. ; Walton, A. J. ; Robertson, J. M. / The measurement of transistor characteristics using on-chip switching for the connection of instrumentation. European Solid-State Device Research Conference. IEEE Computer Society, 1987. pp. 919-922
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