The local structure of amorphous silicon

Michael Treacy, K. B. Borisenko

Research output: Contribution to journalArticle

118 Citations (Scopus)

Abstract

It is widely believed that the continuous random network (CRN) model represents the structural topology of amorphous silicon. The key evidence is that the model can reproduce well experimental reduced density functions (RDFs) obtained by diffraction. By using a combination of electron diffraction and fluctuation electron microscopy (FEM) variance data as experimental constraints in a structural relaxation procedure, we show that the CRN is not unique in matching the experimental RDF. We find that inhomogeneous paracrystalline structures containing local cubic ordering at the 10 to 20 angstrom length scale are also fully consistent with the RDF data. Crucially, they also matched the FEM variance data, unlike the CRN model. The paracrystalline model has implications for understanding phase transformation processes in various materials that extend beyond amorphous silicon.

Original languageEnglish (US)
Pages (from-to)950-953
Number of pages4
JournalScience
Volume335
Issue number6071
DOIs
StatePublished - Feb 24 2012

Fingerprint

Silicon
Structural Models
Transmission Electron Microscopy
Electron Microscopy
Electrons

ASJC Scopus subject areas

  • General

Cite this

The local structure of amorphous silicon. / Treacy, Michael; Borisenko, K. B.

In: Science, Vol. 335, No. 6071, 24.02.2012, p. 950-953.

Research output: Contribution to journalArticle

Treacy, Michael ; Borisenko, K. B. / The local structure of amorphous silicon. In: Science. 2012 ; Vol. 335, No. 6071. pp. 950-953.
@article{4a6b13cb5cf845fca01e72da032358d6,
title = "The local structure of amorphous silicon",
abstract = "It is widely believed that the continuous random network (CRN) model represents the structural topology of amorphous silicon. The key evidence is that the model can reproduce well experimental reduced density functions (RDFs) obtained by diffraction. By using a combination of electron diffraction and fluctuation electron microscopy (FEM) variance data as experimental constraints in a structural relaxation procedure, we show that the CRN is not unique in matching the experimental RDF. We find that inhomogeneous paracrystalline structures containing local cubic ordering at the 10 to 20 angstrom length scale are also fully consistent with the RDF data. Crucially, they also matched the FEM variance data, unlike the CRN model. The paracrystalline model has implications for understanding phase transformation processes in various materials that extend beyond amorphous silicon.",
author = "Michael Treacy and Borisenko, {K. B.}",
year = "2012",
month = "2",
day = "24",
doi = "10.1126/science.1214780",
language = "English (US)",
volume = "335",
pages = "950--953",
journal = "Science",
issn = "0036-8075",
publisher = "American Association for the Advancement of Science",
number = "6071",

}

TY - JOUR

T1 - The local structure of amorphous silicon

AU - Treacy, Michael

AU - Borisenko, K. B.

PY - 2012/2/24

Y1 - 2012/2/24

N2 - It is widely believed that the continuous random network (CRN) model represents the structural topology of amorphous silicon. The key evidence is that the model can reproduce well experimental reduced density functions (RDFs) obtained by diffraction. By using a combination of electron diffraction and fluctuation electron microscopy (FEM) variance data as experimental constraints in a structural relaxation procedure, we show that the CRN is not unique in matching the experimental RDF. We find that inhomogeneous paracrystalline structures containing local cubic ordering at the 10 to 20 angstrom length scale are also fully consistent with the RDF data. Crucially, they also matched the FEM variance data, unlike the CRN model. The paracrystalline model has implications for understanding phase transformation processes in various materials that extend beyond amorphous silicon.

AB - It is widely believed that the continuous random network (CRN) model represents the structural topology of amorphous silicon. The key evidence is that the model can reproduce well experimental reduced density functions (RDFs) obtained by diffraction. By using a combination of electron diffraction and fluctuation electron microscopy (FEM) variance data as experimental constraints in a structural relaxation procedure, we show that the CRN is not unique in matching the experimental RDF. We find that inhomogeneous paracrystalline structures containing local cubic ordering at the 10 to 20 angstrom length scale are also fully consistent with the RDF data. Crucially, they also matched the FEM variance data, unlike the CRN model. The paracrystalline model has implications for understanding phase transformation processes in various materials that extend beyond amorphous silicon.

UR - http://www.scopus.com/inward/record.url?scp=84857572527&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84857572527&partnerID=8YFLogxK

U2 - 10.1126/science.1214780

DO - 10.1126/science.1214780

M3 - Article

VL - 335

SP - 950

EP - 953

JO - Science

JF - Science

SN - 0036-8075

IS - 6071

ER -