The Influence of Conductor Particle Size Distribution on the Blending Curve of Epoxy-Based Thick Film Resistors

Bulent Ulug, John M. Robertson, Peter J.S. Ewen

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher values as the spread of the conductor particle size distribution decreases. The results are interpreted in terms of a model whose main parameter is the contact probability for the conductor particles.

Original languageEnglish (US)
Pages (from-to)277-284
Number of pages8
JournalElectroComponent Science and Technology
Volume10
Issue number4
DOIs
StatePublished - Jan 1 1983

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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