The impact of NBTI on the performance of combinational and sequential circuits

Wenping Wang, Shengqi Yang, Sarvesh Bhardwaj, Rakesh Vattikonda, Sarma Vrudhula, Frank Liu, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

158 Citations (Scopus)

Abstract

Negative-bias-temperature-instability (NBTI) has become the primary limiting factor of circuit lifetime. In this work, we develop a general framework for analyzing the impact of NBTI on the performance of a circuit, based on various circuit parameters such as the supply voltage, temperature, and node switching activity of the signals etc. We propose an efficient method to predict the degradation of circuit performance based on circuit topology and the switching activity of the signals over long periods of time. We demonstrate our results on ISCAS benchmarks and a 65nm industrial design. The framework is used to provide key design insights for designing reliable circuits. The key design insights that we obtain are: (1) degradation due to NBTI is most sensitive on the input patterns and the duty cycle; the difference in the delay degradation can be up to 5X for various static and dynamic conditions, (2) during dynamic operation, NBTI-induced degradation is relatively insensitive to supply voltage, but strongly dependent on temperature; (3) NBTI has marginal impact on the clock signal.

Original languageEnglish (US)
Title of host publicationProceedings - Design Automation Conference
Pages364-369
Number of pages6
DOIs
StatePublished - 2007
Event2007 44th ACM/IEEE Design Automation Conference, DAC'07 - San Diego, CA, United States
Duration: Jun 4 2007Jun 8 2007

Other

Other2007 44th ACM/IEEE Design Automation Conference, DAC'07
CountryUnited States
CitySan Diego, CA
Period6/4/076/8/07

Fingerprint

Sequential circuits
Combinatorial circuits
Networks (circuits)
Degradation
Electric network topology
Electric potential
Product design
Clocks
Negative bias temperature instability
Temperature

Keywords

  • Duty cycle
  • Input pattern
  • NBTI
  • Performance degradation
  • Speed
  • Supply voltage
  • Temperature

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering

Cite this

Wang, W., Yang, S., Bhardwaj, S., Vattikonda, R., Vrudhula, S., Liu, F., & Cao, Y. (2007). The impact of NBTI on the performance of combinational and sequential circuits. In Proceedings - Design Automation Conference (pp. 364-369). [4261207] https://doi.org/10.1109/DAC.2007.375188

The impact of NBTI on the performance of combinational and sequential circuits. / Wang, Wenping; Yang, Shengqi; Bhardwaj, Sarvesh; Vattikonda, Rakesh; Vrudhula, Sarma; Liu, Frank; Cao, Yu.

Proceedings - Design Automation Conference. 2007. p. 364-369 4261207.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wang, W, Yang, S, Bhardwaj, S, Vattikonda, R, Vrudhula, S, Liu, F & Cao, Y 2007, The impact of NBTI on the performance of combinational and sequential circuits. in Proceedings - Design Automation Conference., 4261207, pp. 364-369, 2007 44th ACM/IEEE Design Automation Conference, DAC'07, San Diego, CA, United States, 6/4/07. https://doi.org/10.1109/DAC.2007.375188
Wang W, Yang S, Bhardwaj S, Vattikonda R, Vrudhula S, Liu F et al. The impact of NBTI on the performance of combinational and sequential circuits. In Proceedings - Design Automation Conference. 2007. p. 364-369. 4261207 https://doi.org/10.1109/DAC.2007.375188
Wang, Wenping ; Yang, Shengqi ; Bhardwaj, Sarvesh ; Vattikonda, Rakesh ; Vrudhula, Sarma ; Liu, Frank ; Cao, Yu. / The impact of NBTI on the performance of combinational and sequential circuits. Proceedings - Design Automation Conference. 2007. pp. 364-369
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