The high resolution electron microscopy of stacking defects in Cu–Zn–Al shape memory alloy

J. M. Cook; M. A. O'Keefe; David J. Smith; W. M. Stobbs

doi:10.1111/j.1365-2818.1983.tb04186.x

The high resolution electron microscopy of stacking defects in Cu–Zn–Al shape memory alloy

J. M. Cook, M. A. O'Keefe, David J. Smith, W. M. Stobbs

Research output: Contribution to journal › Article › peer-review

48 Scopus citations

Abstract

The characteristic defects in the martensitic phase of the memory alloy Cu–Zn–Al have been investigated using the Cambridge University 600 kV High Resolution Electron Microscope. Conditions are found under which the images can be quantitatively simulated when this involves the transfer of structural information at resolutions beyond the first zero of the contrast transfer function. Defects of sequence‐type were positively identified by the comparison of high‐resolution micrographs with full dynamical image simulations. 1983 Blackwell Science Ltd

Original language	English (US)
Pages (from-to)	295-306
Number of pages	12
Journal	Journal of Microscopy
Volume	129
Issue number	3
DOIs	https://doi.org/10.1111/j.1365-2818.1983.tb04186.x
State	Published - Mar 1983
Externally published	Yes

Keywords

Cu–Zn–Al
HREM
shape memory
stacking faults

ASJC Scopus subject areas

Pathology and Forensic Medicine
Histology

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10.1111/j.1365-2818.1983.tb04186.x

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abstract = "The characteristic defects in the martensitic phase of the memory alloy Cu–Zn–Al have been investigated using the Cambridge University 600 kV High Resolution Electron Microscope. Conditions are found under which the images can be quantitatively simulated when this involves the transfer of structural information at resolutions beyond the first zero of the contrast transfer function. Defects of sequence‐type were positively identified by the comparison of high‐resolution micrographs with full dynamical image simulations. 1983 Blackwell Science Ltd",

keywords = "Cu–Zn–Al, HREM, shape memory, stacking faults",

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AU - Smith, David J.

AU - Stobbs, W. M.

PY - 1983/3

Y1 - 1983/3

N2 - The characteristic defects in the martensitic phase of the memory alloy Cu–Zn–Al have been investigated using the Cambridge University 600 kV High Resolution Electron Microscope. Conditions are found under which the images can be quantitatively simulated when this involves the transfer of structural information at resolutions beyond the first zero of the contrast transfer function. Defects of sequence‐type were positively identified by the comparison of high‐resolution micrographs with full dynamical image simulations. 1983 Blackwell Science Ltd

AB - The characteristic defects in the martensitic phase of the memory alloy Cu–Zn–Al have been investigated using the Cambridge University 600 kV High Resolution Electron Microscope. Conditions are found under which the images can be quantitatively simulated when this involves the transfer of structural information at resolutions beyond the first zero of the contrast transfer function. Defects of sequence‐type were positively identified by the comparison of high‐resolution micrographs with full dynamical image simulations. 1983 Blackwell Science Ltd

KW - Cu–Zn–Al

KW - HREM

KW - shape memory

KW - stacking faults

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The high resolution electron microscopy of stacking defects in Cu–Zn–Al shape memory alloy

Abstract

Keywords

ASJC Scopus subject areas

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