The energy dependence of proton-induced degradation in AlGaN/GaN high electron mobility transistors

Xinwen Hu, Bo K. Choi, Hugh J. Barnaby, Daniel M. Fleetwood, Ronald D. Schrimpf, Sungchul Lee, S. Shojah-Ardalan, R. Wilkins, Umesh K. Mishra, Ross W. Dettmer

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