@article{7bf3f505cb4a4d9a9c4ee5561de8a660,
title = "The effects of hydrogen in hermetically sealed packages on the total dose and dose rate response of bipolar linear circuits",
abstract = "It is demonstrated with test transistors and circuits that a small amount of hydrogen trapped in hermetically sealed packages can significantly degrade the total dose and dose rate response of bipolar linear microelectronics. In addition, we show that when exposed to an atmosphere of 100% molecular hydrogen dies with silicon nitride passivation are unaffected, whereas dies with silicon carbide or deposited oxides become very soft at high and low dose rate.",
keywords = "Dose rate, Enhanced low-dose-rate sensitivity, Hydrogen, Interface traps, Radiation effects, Temperature transducer, Total ionizing dose, Voltage comparator",
author = "Pease, {Ronald L.} and Platteter, {Dale G.} and Dunham, {Gary W.} and Seiler, {John E.} and Adell, {Philippe C.} and Hugh Barnaby and Jie Chen",
note = "Funding Information: Manuscript received July 18, 2007; revised August 29, 2007. This work was sponsored by the Defense Threat Reduction Agency through Contract N00164-02-D-6599 with NAVSEA Crane and ATK Mission Research and by the NASA Electronic Parts Program. R. L. Pease is with RLP Research, Los Lunas, NM 87031 USA (e-mail: lsrl-pease@wildblue.net). D. G. Platteter, retired, was with NAVSEA Crane, Crane, IN 47522 USA. He now resides in Bedford, IN 47421 USA. G. W. Dunham and J. E. Seiler are with NAVSEA Crane, Crane, IN 47522 USA (e-mail: gary.dunham@navy.mi; john.seiler@navy.mil). P. C. Adell is with the Jet Propulsion Laboratory, Pasadena, CA 91109 USA (e-mail: philippe.c.adell@jpl.nasa.gov). H. J. Barnaby and J. Chen are with Arizona State University, Tempe, AZ 85287 USA (e-mail: hbarnaby@asu.edu; j.chen@asu.edu). Digital Object Identifier 10.1109/TNS.2007.907870",
year = "2007",
month = dec,
doi = "10.1109/TNS.2007.907870",
language = "English (US)",
volume = "54",
pages = "2168--2173",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",
}