The effects of hydrogen in hermetically sealed packages on the total dose and dose rate response of bipolar linear circuits

Ronald L. Pease, Dale G. Platteter, Gary W. Dunham, John E. Seiler, Philippe C. Adell, Hugh Barnaby, Jie Chen

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

It is demonstrated with test transistors and circuits that a small amount of hydrogen trapped in hermetically sealed packages can significantly degrade the total dose and dose rate response of bipolar linear microelectronics. In addition, we show that when exposed to an atmosphere of 100% molecular hydrogen dies with silicon nitride passivation are unaffected, whereas dies with silicon carbide or deposited oxides become very soft at high and low dose rate.

Original languageEnglish (US)
Pages (from-to)2168-2173
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume54
Issue number6
DOIs
StatePublished - Dec 2007

Fingerprint

linear circuits
dosage
Hydrogen
Networks (circuits)
hydrogen
Silicon nitride
Passivation
Silicon carbide
Microelectronics
Transistors
silicon nitrides
microelectronics
silicon carbides
passivity
Oxides
transistors
atmospheres
oxides

Keywords

  • Dose rate
  • Enhanced low-dose-rate sensitivity
  • Hydrogen
  • Interface traps
  • Radiation effects
  • Temperature transducer
  • Total ionizing dose
  • Voltage comparator

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

Cite this

The effects of hydrogen in hermetically sealed packages on the total dose and dose rate response of bipolar linear circuits. / Pease, Ronald L.; Platteter, Dale G.; Dunham, Gary W.; Seiler, John E.; Adell, Philippe C.; Barnaby, Hugh; Chen, Jie.

In: IEEE Transactions on Nuclear Science, Vol. 54, No. 6, 12.2007, p. 2168-2173.

Research output: Contribution to journalArticle

Pease, Ronald L. ; Platteter, Dale G. ; Dunham, Gary W. ; Seiler, John E. ; Adell, Philippe C. ; Barnaby, Hugh ; Chen, Jie. / The effects of hydrogen in hermetically sealed packages on the total dose and dose rate response of bipolar linear circuits. In: IEEE Transactions on Nuclear Science. 2007 ; Vol. 54, No. 6. pp. 2168-2173.
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