The distribution of intensity in electron diifraction patterns due to phonon scattering

Peter Rez, C. J. Humphreys, M. J. Whelan

Research output: Contribution to journalArticle

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Abstract

The diffuse intensity in electron diffraction patterns is studied for the case when electrons represented by many-beam Bloch waves are singly scattered by phonons. The expressions derived take into account the partial coherence effects resulting from summation over the crystal normal modes. Plots of the distribution of intensity along a 111 row of systematic reflections are given for a number of face centred cubic metals, and plots of thickness fringes are calculated for various aperture positions along and perpendicular to the systematic row.

Original languageEnglish (US)
Pages (from-to)81-96
Number of pages16
JournalPhilosophical Magazine
Volume35
Issue number1
DOIs
StatePublished - 1977
Externally publishedYes

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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