The advanced unified defect model and its applications

W. E. Spicer, T. Kendelewicz, N. Newman, R. Cao, C. McCants, K. Miyano, I. Lindau, Z. Liliental-Weber, E. R. Weber

Research output: Contribution to journal › Article › peer-review

55 Scopus citations

Fingerprint Dive into the research topics of 'The advanced unified defect model and its applications'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy