TY - JOUR
T1 - The (100) silicon silicon dioxide interface. II. The Si LVV Auger lines
AU - Kunjunny, T.
AU - Ferry, D. K.
N1 - Copyright:
Copyright 2015 Elsevier B.V., All rights reserved.
PY - 1981
Y1 - 1981
N2 - The electronic state, calculated by a slab semiempirical tight-binding method, is utilized to calculate the Si L2,3VV Auger transition line shapes. These calculations are carried out for (a) the free Si(100) surface, (b) the 2 × 1 reconstructed surface, (c) the oxygen chemisorbed surface (for both atomic and molecular oxygen), and (d) the interface between a thin oxide and Si. New states which are typical of the SiO bonds appear as characteristic peaks corresponding to these states in the Auger spectra. These lie between the positions of the Si peak in the bulk Si and SiO2 and correspond to previously observed experimental peaks. From comparison with the available experimental data, it appears that the initial oxidation is by atomic oxygen rather than by molecular oxygen.
AB - The electronic state, calculated by a slab semiempirical tight-binding method, is utilized to calculate the Si L2,3VV Auger transition line shapes. These calculations are carried out for (a) the free Si(100) surface, (b) the 2 × 1 reconstructed surface, (c) the oxygen chemisorbed surface (for both atomic and molecular oxygen), and (d) the interface between a thin oxide and Si. New states which are typical of the SiO bonds appear as characteristic peaks corresponding to these states in the Auger spectra. These lie between the positions of the Si peak in the bulk Si and SiO2 and correspond to previously observed experimental peaks. From comparison with the available experimental data, it appears that the initial oxidation is by atomic oxygen rather than by molecular oxygen.
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U2 - 10.1103/PhysRevB.24.4604
DO - 10.1103/PhysRevB.24.4604
M3 - Article
AN - SCOPUS:26744459351
SN - 0163-1829
VL - 24
SP - 4604
EP - 4610
JO - Physical Review B
JF - Physical Review B
IS - 8
ER -