Abstract

Substrate surface roughness effects on Ag film texture were investigated using pole figure analysis. X-ray diffraction results confirmed that Ag thin films on smooth SiO2 substrates had strong {111} texture when compared with Ag films on polyethylene naphthalate (PEN). It was noted that the difference of strain energy density (ΔEe) in Ag film on PEN (0.039 MPa) was almost 5 times greater than that on SiO2 (0.0084 MPa). The comparison between surface and strain energies revealed that the {111} texture of Ag thin film on SiO2 was explained by minimization of the surface energy and the weaker {111} texture of Ag on PEN was a result of reduced diffusion length of Ag adatoms on the rough PEN surface.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings
Pages147-152
Number of pages6
Volume990
StatePublished - 2007
Event2007 MRS Spring Meeting - San Francisco, CA, United States
Duration: Apr 10 2007Apr 12 2007

Other

Other2007 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period4/10/074/12/07

Fingerprint

Polyethylene
Silver
Polyethylenes
Textures
X ray diffraction
Thin films
Substrates
Strain energy
Interfacial energy
Adatoms
Poles
Surface roughness

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Zoo, Y., & Alford, T. (2007). Texture evolution and stress in silver thin films on different substrates using X-ray diffraction. In Materials Research Society Symposium Proceedings (Vol. 990, pp. 147-152)

Texture evolution and stress in silver thin films on different substrates using X-ray diffraction. / Zoo, Yeongseok; Alford, Terry.

Materials Research Society Symposium Proceedings. Vol. 990 2007. p. 147-152.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zoo, Y & Alford, T 2007, Texture evolution and stress in silver thin films on different substrates using X-ray diffraction. in Materials Research Society Symposium Proceedings. vol. 990, pp. 147-152, 2007 MRS Spring Meeting, San Francisco, CA, United States, 4/10/07.
Zoo Y, Alford T. Texture evolution and stress in silver thin films on different substrates using X-ray diffraction. In Materials Research Society Symposium Proceedings. Vol. 990. 2007. p. 147-152
Zoo, Yeongseok ; Alford, Terry. / Texture evolution and stress in silver thin films on different substrates using X-ray diffraction. Materials Research Society Symposium Proceedings. Vol. 990 2007. pp. 147-152
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