Abstract
Substrate surface roughness effects on Ag film texture were investigated using pole figure analysis. X-ray diffraction results confirmed that Ag thin films on smooth SiO2 substrates had strong {111} texture when compared with Ag films on polyethylene naphthalate (PEN). It was noted that the difference of strain energy density (ΔEe) in Ag film on PEN (0.039 MPa) was almost 5 times greater than that on SiO2 (0.0084 MPa). The comparison between surface and strain energies revealed that the {111} texture of Ag thin film on SiO2 was explained by minimization of the surface energy and the weaker {111} texture of Ag on PEN was a result of reduced diffusion length of Ag adatoms on the rough PEN surface.
| Original language | English (US) |
|---|---|
| Title of host publication | Materials Research Society Symposium Proceedings |
| Pages | 147-152 |
| Number of pages | 6 |
| Volume | 990 |
| State | Published - 2007 |
| Event | 2007 MRS Spring Meeting - San Francisco, CA, United States Duration: Apr 10 2007 → Apr 12 2007 |
Other
| Other | 2007 MRS Spring Meeting |
|---|---|
| Country | United States |
| City | San Francisco, CA |
| Period | 4/10/07 → 4/12/07 |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
Cite this
Texture evolution and stress in silver thin films on different substrates using X-ray diffraction. / Zoo, Yeongseok; Alford, Terry.
Materials Research Society Symposium Proceedings. Vol. 990 2007. p. 147-152.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Texture evolution and stress in silver thin films on different substrates using X-ray diffraction
AU - Zoo, Yeongseok
AU - Alford, Terry
PY - 2007
Y1 - 2007
N2 - Substrate surface roughness effects on Ag film texture were investigated using pole figure analysis. X-ray diffraction results confirmed that Ag thin films on smooth SiO2 substrates had strong {111} texture when compared with Ag films on polyethylene naphthalate (PEN). It was noted that the difference of strain energy density (ΔEe) in Ag film on PEN (0.039 MPa) was almost 5 times greater than that on SiO2 (0.0084 MPa). The comparison between surface and strain energies revealed that the {111} texture of Ag thin film on SiO2 was explained by minimization of the surface energy and the weaker {111} texture of Ag on PEN was a result of reduced diffusion length of Ag adatoms on the rough PEN surface.
AB - Substrate surface roughness effects on Ag film texture were investigated using pole figure analysis. X-ray diffraction results confirmed that Ag thin films on smooth SiO2 substrates had strong {111} texture when compared with Ag films on polyethylene naphthalate (PEN). It was noted that the difference of strain energy density (ΔEe) in Ag film on PEN (0.039 MPa) was almost 5 times greater than that on SiO2 (0.0084 MPa). The comparison between surface and strain energies revealed that the {111} texture of Ag thin film on SiO2 was explained by minimization of the surface energy and the weaker {111} texture of Ag on PEN was a result of reduced diffusion length of Ag adatoms on the rough PEN surface.
UR - http://www.scopus.com/inward/record.url?scp=41549091057&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=41549091057&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:41549091057
SN - 9781558999503
VL - 990
SP - 147
EP - 152
BT - Materials Research Society Symposium Proceedings
ER -