Texture and microstructural evolution of thin silver films in Ag/Ti bilayers

Yuxiao Zeng, Terry Alford, Y. L. Zou, Adam Amali, B. Manfred Ullrich, F. Deng, S. S. Lau

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

The texture and microstructure of thin silver films in Ag/Ti bilayer structures have been characterized as a function of vacuum annealing temperature and time with the use of x-ray diffraction and transmission electron microscopy. A strong preexisting (111) texture in Ag films was further improved upon annealing as evidenced by an increased intensity and narrower distribution of the texture along the film normal. A new (200) texture component was generated after 600°C annealing: it however had a relatively low intensity when compared to the dominant (111) texture. No abnormal grain growth was observed in annealed Ag films. The texture evolution in all films appeared to complete within the first 15 min annealing, while the microstructure continued to change with additional annealing time. The roles of both surface energy and strain energy in the grain growth were evaluated. A model of the grain growth and texture evolution has been proposed to explain these observations.

Original languageEnglish (US)
Pages (from-to)779-785
Number of pages7
JournalJournal of Applied Physics
Volume83
Issue number2
DOIs
StatePublished - Jan 15 1998

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Texture and microstructural evolution of thin silver films in Ag/Ti bilayers'. Together they form a unique fingerprint.

Cite this