Abstract
As the use of wireless communications in daily life increases, attaining low-cost solutions becomes increasingly important due to shrinking profit margins. Cost optimization that solely targets at minimization of the cost of system architecture may result in sub-optimal, highly untestable, solutions. Test design and design for testability need to be incorporated into the system design flow to achieve viable solutions. This paper presents an analysis of test requirements, implications and test cost for low-cost Bluetooth systems. Testability problems are identified and possible solutions along with avenues to reduce the test cost by utilizing lower-cost testers are discussed.
| Original language | English (US) |
|---|---|
| Title of host publication | IEEE International Test Conference (TC) |
| Pages | 965-974 |
| Number of pages | 10 |
| State | Published - 2001 |
| Externally published | Yes |
| Event | International Test Conference 2001 Proceedings - Baltimore, MD, United States Duration: Oct 30 2001 → Nov 1 2001 |
Other
| Other | International Test Conference 2001 Proceedings |
|---|---|
| Country/Territory | United States |
| City | Baltimore, MD |
| Period | 10/30/01 → 11/1/01 |
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials