Test-to-failure of PV modules: Hotspot testing

Janu K. Mathew; Joseph Kuitche; Govindasamy TamizhMani

doi:10.1109/PVSC.2010.5616895

Test-to-failure of PV modules: Hotspot testing

Janu K. Mathew, Joseph Kuitche, Govindasamy TamizhMani

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Scopus citations

Abstract

The primary goal in the qualification testing is to identify the short-term reliability issues in the field. The primary goal in the accelerated reliability or lifetime testing is to identify the initial, operational and ultimate reliability issues in the field so that the lifetime can be predicted and warranty can be protected. The test-to-failure (TTF) testing is a compromise and it falls between these two extremes of qualification testing and lifetime/reliability testing. One of the major reliability issues of photovoltaic modules in the field is the hotspot endurance. A TTF study involving hotspot stress along with thermal cycling stress is undertaken and is presented in this paper.

Original language	English (US)
Title of host publication	Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Pages	2839-2843
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC.2010.5616895
State	Published - Dec 20 2010
Event	35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States Duration: Jun 20 2010 → Jun 25 2010

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Country/Territory	United States
City	Honolulu, HI
Period	6/20/10 → 6/25/10

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2010.5616895

Cite this

Mathew, JK, Kuitche, J & TamizhMani, G 2010, Test-to-failure of PV modules: Hotspot testing. in Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010., 5616895, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 2839-2843, 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States, 6/20/10. https://doi.org/10.1109/PVSC.2010.5616895

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abstract = "The primary goal in the qualification testing is to identify the short-term reliability issues in the field. The primary goal in the accelerated reliability or lifetime testing is to identify the initial, operational and ultimate reliability issues in the field so that the lifetime can be predicted and warranty can be protected. The test-to-failure (TTF) testing is a compromise and it falls between these two extremes of qualification testing and lifetime/reliability testing. One of the major reliability issues of photovoltaic modules in the field is the hotspot endurance. A TTF study involving hotspot stress along with thermal cycling stress is undertaken and is presented in this paper.",

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N2 - The primary goal in the qualification testing is to identify the short-term reliability issues in the field. The primary goal in the accelerated reliability or lifetime testing is to identify the initial, operational and ultimate reliability issues in the field so that the lifetime can be predicted and warranty can be protected. The test-to-failure (TTF) testing is a compromise and it falls between these two extremes of qualification testing and lifetime/reliability testing. One of the major reliability issues of photovoltaic modules in the field is the hotspot endurance. A TTF study involving hotspot stress along with thermal cycling stress is undertaken and is presented in this paper.

AB - The primary goal in the qualification testing is to identify the short-term reliability issues in the field. The primary goal in the accelerated reliability or lifetime testing is to identify the initial, operational and ultimate reliability issues in the field so that the lifetime can be predicted and warranty can be protected. The test-to-failure (TTF) testing is a compromise and it falls between these two extremes of qualification testing and lifetime/reliability testing. One of the major reliability issues of photovoltaic modules in the field is the hotspot endurance. A TTF study involving hotspot stress along with thermal cycling stress is undertaken and is presented in this paper.

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Test-to-failure of PV modules: Hotspot testing

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