Test-to-failure of PV modules: Hotspot testing

Janu K. Mathew, Joseph Kuitche, Govindasamy TamizhMani

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Scopus citations

    Abstract

    The primary goal in the qualification testing is to identify the short-term reliability issues in the field. The primary goal in the accelerated reliability or lifetime testing is to identify the initial, operational and ultimate reliability issues in the field so that the lifetime can be predicted and warranty can be protected. The test-to-failure (TTF) testing is a compromise and it falls between these two extremes of qualification testing and lifetime/reliability testing. One of the major reliability issues of photovoltaic modules in the field is the hotspot endurance. A TTF study involving hotspot stress along with thermal cycling stress is undertaken and is presented in this paper.

    Original languageEnglish (US)
    Title of host publicationProgram - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
    Pages2839-2843
    Number of pages5
    DOIs
    StatePublished - Dec 20 2010
    Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
    Duration: Jun 20 2010Jun 25 2010

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371

    Other

    Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
    CountryUnited States
    CityHonolulu, HI
    Period6/20/106/25/10

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering
    • Electrical and Electronic Engineering

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  • Cite this

    Mathew, J. K., Kuitche, J., & TamizhMani, G. (2010). Test-to-failure of PV modules: Hotspot testing. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 (pp. 2839-2843). [5616895] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2010.5616895