TY - JOUR
T1 - Test planning and test resource optimization For droplet-based microfluidic systems
AU - Su, Fei
AU - Ozev, Sule
AU - Chakrabarty, Krishnendu
N1 - Funding Information:
∗This research was supported in part by the National Science Foundation under grant number IIS-0312352. A preliminary version of this paper appeared in Proc. European Test Symposium. pp. 72–77, 2004
PY - 2006/4
Y1 - 2006/4
N2 - Recent years have seen the emergence of droplet-based microfluidic systems for safety-critical biomedical applications. In order to ensure reliability, microsystems incorporating microfluidic components must be tested adequately. In this paper, we investigate test planning and test resource optimization for droplet-based microfluidic arrays. We first formulate the test planning problem and prove that it is NP-hard. We then describe an optimization method based on integer linear programming (ILP) that yields optimal solutions. Due to the NP-hard nature of the problem, we develop heuristic approaches for optimization. Experimental results indicate that for large array sizes, the heuristic methods yield solutions that are close to provable lower bounds. These heuristics ensure scalability and low computation cost.
AB - Recent years have seen the emergence of droplet-based microfluidic systems for safety-critical biomedical applications. In order to ensure reliability, microsystems incorporating microfluidic components must be tested adequately. In this paper, we investigate test planning and test resource optimization for droplet-based microfluidic arrays. We first formulate the test planning problem and prove that it is NP-hard. We then describe an optimization method based on integer linear programming (ILP) that yields optimal solutions. Due to the NP-hard nature of the problem, we develop heuristic approaches for optimization. Experimental results indicate that for large array sizes, the heuristic methods yield solutions that are close to provable lower bounds. These heuristics ensure scalability and low computation cost.
KW - Concurrent testing
KW - Droplet-based microfluidic systems
KW - Microfluidic arrays
KW - Test planning
KW - Test resource optimization
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U2 - 10.1007/s10836-005-1256-3
DO - 10.1007/s10836-005-1256-3
M3 - Review article
AN - SCOPUS:33646744418
SN - 0923-8174
VL - 22
SP - 199
EP - 210
JO - Journal of Electronic Testing: Theory and Applications (JETTA)
JF - Journal of Electronic Testing: Theory and Applications (JETTA)
IS - 2
ER -