Test planning and test resource optimization For droplet-based microfluidic systems

Fei Su, Sule Ozev, Krishnendu Chakrabarty

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

Recent years have seen the emergence of droplet-based microfluidic systems for safety-critical biomedical applications. In order to ensure reliability, microsystems incorporating microfluidic components must be tested adequately. In this paper, we investigate test planning and test resource optimization for droplet-based microfluidic arrays. We first formulate the test planning problem and prove that it is NP-hard. We then describe an optimization method based on integer linear programming (ILP) that yields optimal solutions. Due to the NP-hard nature of the problem, we develop heuristic approaches for optimization. Experimental results indicate that for large array sizes, the heuristic methods yield solutions that are close to provable lower bounds. These heuristics ensure scalability and low computation cost.

Original languageEnglish (US)
Pages (from-to)199-210
Number of pages12
JournalJournal of Electronic Testing: Theory and Applications (JETTA)
Volume22
Issue number2
DOIs
StatePublished - Apr 2006
Externally publishedYes

Fingerprint

Microfluidics
Planning
Heuristic methods
Microsystems
Linear programming
Scalability
Costs

Keywords

  • Concurrent testing
  • Droplet-based microfluidic systems
  • Microfluidic arrays
  • Test planning
  • Test resource optimization

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Test planning and test resource optimization For droplet-based microfluidic systems. / Su, Fei; Ozev, Sule; Chakrabarty, Krishnendu.

In: Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 22, No. 2, 04.2006, p. 199-210.

Research output: Contribution to journalArticle

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