TY - JOUR
T1 - Test aignal development and analysis for OFDM systems RF front-end parameter extraction
AU - Nassery, Afsaneh
AU - Erol, Osman Emir
AU - Ozev, Sule
AU - Verhelst, Marian
N1 - Funding Information:
Manuscript received April 6, 2011; revised August 9, 2011; accepted September 26, 2011. Date of current version May 18, 2012. This work was supported in part by the Semiconductor Research Corporation, under Task ID 1836.084, and in part by the National Science Foundation, under Award 1031852. This paper was recommended by Associate Editor A. Ivanov.
PY - 2012
Y1 - 2012
N2 - Testing radio frequency (RF) transceivers requires the measurement of a diverse set of specifications, requiring multiple testing setups. This complicates load board design, debug, and diagnosis, as well as results in long testing time. In this paper, we present a single setup testing solution for orthogonal frequency-division multiplexing systems RF front-ends based on a loop-around scheme. With this technique, it is possible to determine gain and phase mismatch, inphase-quadrature time skew, and dc offset. Linear gain and IIP3 decouple the transmitter parameters from the receiver parameters. Although loop-around has been used in many forms, the basic challenge is to determine what input conditions will lead to accurate measurement and what form of modeling will yield this accuracy. To this end, we develop test signal design and multistep extraction techniques. Experimental results indicate that IIP3 can be extracted with 0.6 dB maximum error while phase mismatch and gain mismatch can be extracted with 0.3$ \circ and 0.6% maximum error. Our method is able to de-embed the characteristics of transmitter from those of receiver while it requires the analysis of only low-frequency digital baseband signals (I and Q branches) and eliminates the need for RF testers.
AB - Testing radio frequency (RF) transceivers requires the measurement of a diverse set of specifications, requiring multiple testing setups. This complicates load board design, debug, and diagnosis, as well as results in long testing time. In this paper, we present a single setup testing solution for orthogonal frequency-division multiplexing systems RF front-ends based on a loop-around scheme. With this technique, it is possible to determine gain and phase mismatch, inphase-quadrature time skew, and dc offset. Linear gain and IIP3 decouple the transmitter parameters from the receiver parameters. Although loop-around has been used in many forms, the basic challenge is to determine what input conditions will lead to accurate measurement and what form of modeling will yield this accuracy. To this end, we develop test signal design and multistep extraction techniques. Experimental results indicate that IIP3 can be extracted with 0.6 dB maximum error while phase mismatch and gain mismatch can be extracted with 0.3$ \circ and 0.6% maximum error. Our method is able to de-embed the characteristics of transmitter from those of receiver while it requires the analysis of only low-frequency digital baseband signals (I and Q branches) and eliminates the need for RF testers.
KW - Orthogonal frequency-division multiplexing (OFDM)
KW - WiMax
KW - power amplifiers
KW - wireless local area network (WLAN)
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U2 - 10.1109/TCAD.2012.2183370
DO - 10.1109/TCAD.2012.2183370
M3 - Article
AN - SCOPUS:84861442150
SN - 0278-0070
VL - 31
SP - 958
EP - 967
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IS - 6
M1 - 6200440
ER -