TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION.

W. O. Saxton; W. K. Jenkins; L. A. Freeman; David J. Smith

TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION.

W. O. Saxton, W. K. Jenkins, L. A. Freeman, David J. Smith

Research output: Contribution to journal › Article › peer-review

Abstract

As well as a substantial improvement in resolution, several previously unreported advantages of bright field hollow-cone illumination are outlined and then illustrated by application to the structure of thin amorphous carbon films. In particular it is demonstrated that there is an optimum focus position and that there are no contrast reversals in the experimental contrast transfer function for considerable focal changes from this position. The possible implications for the high resolution electron microscopy of amorphous materials are briefly discussed.

Original language	English (US)
Pages (from-to)	505-510
Number of pages	6
Journal	Optik (Jena)
Volume	49
Issue number	4
State	Published - Jan 1 1978
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

Cite this

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title = "TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION.",

abstract = "As well as a substantial improvement in resolution, several previously unreported advantages of bright field hollow-cone illumination are outlined and then illustrated by application to the structure of thin amorphous carbon films. In particular it is demonstrated that there is an optimum focus position and that there are no contrast reversals in the experimental contrast transfer function for considerable focal changes from this position. The possible implications for the high resolution electron microscopy of amorphous materials are briefly discussed.",

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AB - As well as a substantial improvement in resolution, several previously unreported advantages of bright field hollow-cone illumination are outlined and then illustrated by application to the structure of thin amorphous carbon films. In particular it is demonstrated that there is an optimum focus position and that there are no contrast reversals in the experimental contrast transfer function for considerable focal changes from this position. The possible implications for the high resolution electron microscopy of amorphous materials are briefly discussed.

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TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION.

Abstract

ASJC Scopus subject areas

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