TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION.

W. O. Saxton, W. K. Jenkins, L. A. Freeman, David Smith

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

As well as a substantial improvement in resolution, several previously unreported advantages of bright field hollow-cone illumination are outlined and then illustrated by application to the structure of thin amorphous carbon films. In particular it is demonstrated that there is an optimum focus position and that there are no contrast reversals in the experimental contrast transfer function for considerable focal changes from this position. The possible implications for the high resolution electron microscopy of amorphous materials are briefly discussed.

Original languageEnglish (US)
Pages (from-to)505-510
Number of pages6
JournalOptik (Jena)
Volume49
Issue number4
StatePublished - Jan 1978
Externally publishedYes

Fingerprint

High resolution electron microscopy
Carbon films
Amorphous carbon
Amorphous films
Transfer functions
Cones
hollow
cones
Lighting
illumination
Transmission electron microscopy
transmission electron microscopy
amorphous materials
transfer functions
electron microscopy
carbon
high resolution

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Saxton, W. O., Jenkins, W. K., Freeman, L. A., & Smith, D. (1978). TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION. Optik (Jena), 49(4), 505-510.

TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION. / Saxton, W. O.; Jenkins, W. K.; Freeman, L. A.; Smith, David.

In: Optik (Jena), Vol. 49, No. 4, 01.1978, p. 505-510.

Research output: Contribution to journalArticle

Saxton, WO, Jenkins, WK, Freeman, LA & Smith, D 1978, 'TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION.', Optik (Jena), vol. 49, no. 4, pp. 505-510.
Saxton WO, Jenkins WK, Freeman LA, Smith D. TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION. Optik (Jena). 1978 Jan;49(4):505-510.
Saxton, W. O. ; Jenkins, W. K. ; Freeman, L. A. ; Smith, David. / TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION. In: Optik (Jena). 1978 ; Vol. 49, No. 4. pp. 505-510.
@article{c5526d813e834d81a4c2674fa48e5172,
title = "TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION.",
abstract = "As well as a substantial improvement in resolution, several previously unreported advantages of bright field hollow-cone illumination are outlined and then illustrated by application to the structure of thin amorphous carbon films. In particular it is demonstrated that there is an optimum focus position and that there are no contrast reversals in the experimental contrast transfer function for considerable focal changes from this position. The possible implications for the high resolution electron microscopy of amorphous materials are briefly discussed.",
author = "Saxton, {W. O.} and Jenkins, {W. K.} and Freeman, {L. A.} and David Smith",
year = "1978",
month = "1",
language = "English (US)",
volume = "49",
pages = "505--510",
journal = "Optik",
issn = "0030-4026",
publisher = "Urban und Fischer Verlag Jena",
number = "4",

}

TY - JOUR

T1 - TEM OBSERVATIONS USING BRIGHT FIELD HOLLOW CONE ILLUMINATION.

AU - Saxton, W. O.

AU - Jenkins, W. K.

AU - Freeman, L. A.

AU - Smith, David

PY - 1978/1

Y1 - 1978/1

N2 - As well as a substantial improvement in resolution, several previously unreported advantages of bright field hollow-cone illumination are outlined and then illustrated by application to the structure of thin amorphous carbon films. In particular it is demonstrated that there is an optimum focus position and that there are no contrast reversals in the experimental contrast transfer function for considerable focal changes from this position. The possible implications for the high resolution electron microscopy of amorphous materials are briefly discussed.

AB - As well as a substantial improvement in resolution, several previously unreported advantages of bright field hollow-cone illumination are outlined and then illustrated by application to the structure of thin amorphous carbon films. In particular it is demonstrated that there is an optimum focus position and that there are no contrast reversals in the experimental contrast transfer function for considerable focal changes from this position. The possible implications for the high resolution electron microscopy of amorphous materials are briefly discussed.

UR - http://www.scopus.com/inward/record.url?scp=0017922841&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0017922841&partnerID=8YFLogxK

M3 - Article

VL - 49

SP - 505

EP - 510

JO - Optik

JF - Optik

SN - 0030-4026

IS - 4

ER -