TEM Analysis of Fe3O4/GaAs Hybrid Ferromagnet/Semiconductor Nanostructures

Sahar Hihath, Paul M. Riechers, Andrew Thron, Jun Chen, Christopher B. Murray, Richard Kiehl, Klaus van Benthem

Research output: Contribution to journalArticle

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)1632-1633
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
StatePublished - 2012
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

Cite this

Hihath, S., Riechers, P. M., Thron, A., Chen, J., Murray, C. B., Kiehl, R., & van Benthem, K. (2012). TEM Analysis of Fe3O4/GaAs Hybrid Ferromagnet/Semiconductor Nanostructures. Microscopy and Microanalysis, 18(S2), 1632-1633. https://doi.org/10.1017/S143192761201001X