Technical program overview

Charles Bouman, Robert Nowak, Anna Scaglione

Research output: Contribution to journalArticle

Original languageEnglish (US)
Article number6736791
JournalUnknown Journal
DOIs
StatePublished - 2013
Externally publishedYes

ASJC Scopus subject areas

  • Information Systems
  • Signal Processing

Cite this

Technical program overview. / Bouman, Charles; Nowak, Robert; Scaglione, Anna.

In: Unknown Journal, 2013.

Research output: Contribution to journalArticle

Bouman, Charles ; Nowak, Robert ; Scaglione, Anna. / Technical program overview. In: Unknown Journal. 2013.
@article{f486b23c08fe4f6aa33e48837eed32d3,
title = "Technical program overview",
author = "Charles Bouman and Robert Nowak and Anna Scaglione",
year = "2013",
doi = "10.1109/GlobalSIP.2013.6736791",
language = "English (US)",
journal = "Scanning Electron Microscopy",
issn = "0586-5581",
publisher = "Scanning Microscopy International",

}

TY - JOUR

T1 - Technical program overview

AU - Bouman, Charles

AU - Nowak, Robert

AU - Scaglione, Anna

PY - 2013

Y1 - 2013

UR - http://www.scopus.com/inward/record.url?scp=84897680127&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84897680127&partnerID=8YFLogxK

U2 - 10.1109/GlobalSIP.2013.6736791

DO - 10.1109/GlobalSIP.2013.6736791

M3 - Article

AN - SCOPUS:84897680127

JO - Scanning Electron Microscopy

JF - Scanning Electron Microscopy

SN - 0586-5581

M1 - 6736791

ER -