Taking atomic force microscope advances to the university classroom

J. D. Adams, G. Priyadarshan, A. Mabogunje, L. J. Leifer, C. F. Quate, E. W. Ong, B. L. Ramakrishna

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The initial findings of a case study conducted on a group of students undergoing a one-semester course on cutting-edge atomic force microscopy (AFM) research are presented. The course included the most recent advances in building high throughput AFMs and had a positive student response. The findings highlighted the potential of using AFM as the focus of a micro-electro-mechanical devices (MEMS)/nanotechnology course for university students.

Original languageEnglish (US)
Title of host publicationIEEE Aerospace Conference Proceedings
Pages73673-73682
Number of pages10
Volume7
StatePublished - 2001
Externally publishedYes
Event2001 IEEE Aerospace Conference - Big Sky, MT, United States
Duration: Mar 10 2001Mar 17 2001

Other

Other2001 IEEE Aerospace Conference
CountryUnited States
CityBig Sky, MT
Period3/10/013/17/01

ASJC Scopus subject areas

  • Aerospace Engineering

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    Adams, J. D., Priyadarshan, G., Mabogunje, A., Leifer, L. J., Quate, C. F., Ong, E. W., & Ramakrishna, B. L. (2001). Taking atomic force microscope advances to the university classroom. In IEEE Aerospace Conference Proceedings (Vol. 7, pp. 73673-73682)