Taking atomic force microscope advances to the university classroom

J. D. Adams, G. Priyadarshan, A. Mabogunje, L. J. Leifer, C. F. Quate, E. W. Ong, B. L. Ramakrishna

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The initial findings of a case study conducted on a group of students undergoing a one-semester course on cutting-edge atomic force microscopy (AFM) research are presented. The course included the most recent advances in building high throughput AFMs and had a positive student response. The findings highlighted the potential of using AFM as the focus of a micro-electro-mechanical devices (MEMS)/nanotechnology course for university students.

Original languageEnglish (US)
Title of host publicationIEEE Aerospace Conference Proceedings
Pages73673-73682
Number of pages10
Volume7
StatePublished - 2001
Externally publishedYes
Event2001 IEEE Aerospace Conference - Big Sky, MT, United States
Duration: Mar 10 2001Mar 17 2001

Other

Other2001 IEEE Aerospace Conference
CountryUnited States
CityBig Sky, MT
Period3/10/013/17/01

Fingerprint

Microscopes
Students
Atomic force microscopy
Electromechanical devices
Nanotechnology
Throughput

ASJC Scopus subject areas

  • Aerospace Engineering

Cite this

Adams, J. D., Priyadarshan, G., Mabogunje, A., Leifer, L. J., Quate, C. F., Ong, E. W., & Ramakrishna, B. L. (2001). Taking atomic force microscope advances to the university classroom. In IEEE Aerospace Conference Proceedings (Vol. 7, pp. 73673-73682)

Taking atomic force microscope advances to the university classroom. / Adams, J. D.; Priyadarshan, G.; Mabogunje, A.; Leifer, L. J.; Quate, C. F.; Ong, E. W.; Ramakrishna, B. L.

IEEE Aerospace Conference Proceedings. Vol. 7 2001. p. 73673-73682.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Adams, JD, Priyadarshan, G, Mabogunje, A, Leifer, LJ, Quate, CF, Ong, EW & Ramakrishna, BL 2001, Taking atomic force microscope advances to the university classroom. in IEEE Aerospace Conference Proceedings. vol. 7, pp. 73673-73682, 2001 IEEE Aerospace Conference, Big Sky, MT, United States, 3/10/01.
Adams JD, Priyadarshan G, Mabogunje A, Leifer LJ, Quate CF, Ong EW et al. Taking atomic force microscope advances to the university classroom. In IEEE Aerospace Conference Proceedings. Vol. 7. 2001. p. 73673-73682
Adams, J. D. ; Priyadarshan, G. ; Mabogunje, A. ; Leifer, L. J. ; Quate, C. F. ; Ong, E. W. ; Ramakrishna, B. L. / Taking atomic force microscope advances to the university classroom. IEEE Aerospace Conference Proceedings. Vol. 7 2001. pp. 73673-73682
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