Taking atomic force microscope advances to the university classroom

J. D. Adams; G. Priyadarshan; A. Mabogunje; L. J. Leifer; C. F. Quate; E. W. Ong; B. L. Ramakrishna

Taking atomic force microscope advances to the university classroom

J. D. Adams, G. Priyadarshan, A. Mabogunje, L. J. Leifer, C. F. Quate, E. W. Ong, B. L. Ramakrishna

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The initial findings of a case study conducted on a group of students undergoing a one-semester course on cutting-edge atomic force microscopy (AFM) research are presented. The course included the most recent advances in building high throughput AFMs and had a positive student response. The findings highlighted the potential of using AFM as the focus of a micro-electro-mechanical devices (MEMS)/nanotechnology course for university students.

Original language	English (US)
Title of host publication	IEEE Aerospace Conference Proceedings
Pages	73673-73682
Number of pages	10
Volume	7
State	Published - 2001
Externally published	Yes
Event	2001 IEEE Aerospace Conference - Big Sky, MT, United States Duration: Mar 10 2001 → Mar 17 2001

Other

Other	2001 IEEE Aerospace Conference
Country/Territory	United States
City	Big Sky, MT
Period	3/10/01 → 3/17/01

ASJC Scopus subject areas

Aerospace Engineering

Cite this

@inproceedings{ddb5c42357af4719a314ef52777d9561,

title = "Taking atomic force microscope advances to the university classroom",

abstract = "The initial findings of a case study conducted on a group of students undergoing a one-semester course on cutting-edge atomic force microscopy (AFM) research are presented. The course included the most recent advances in building high throughput AFMs and had a positive student response. The findings highlighted the potential of using AFM as the focus of a micro-electro-mechanical devices (MEMS)/nanotechnology course for university students.",

author = "Adams, {J. D.} and G. Priyadarshan and A. Mabogunje and Leifer, {L. J.} and Quate, {C. F.} and Ong, {E. W.} and Ramakrishna, {B. L.}",

year = "2001",

language = "English (US)",

volume = "7",

pages = "73673--73682",

booktitle = "IEEE Aerospace Conference Proceedings",

note = "2001 IEEE Aerospace Conference ; Conference date: 10-03-2001 Through 17-03-2001",

}

TY - GEN

T1 - Taking atomic force microscope advances to the university classroom

AU - Adams, J. D.

AU - Priyadarshan, G.

AU - Mabogunje, A.

AU - Leifer, L. J.

AU - Quate, C. F.

AU - Ong, E. W.

AU - Ramakrishna, B. L.

PY - 2001

Y1 - 2001

N2 - The initial findings of a case study conducted on a group of students undergoing a one-semester course on cutting-edge atomic force microscopy (AFM) research are presented. The course included the most recent advances in building high throughput AFMs and had a positive student response. The findings highlighted the potential of using AFM as the focus of a micro-electro-mechanical devices (MEMS)/nanotechnology course for university students.

AB - The initial findings of a case study conducted on a group of students undergoing a one-semester course on cutting-edge atomic force microscopy (AFM) research are presented. The course included the most recent advances in building high throughput AFMs and had a positive student response. The findings highlighted the potential of using AFM as the focus of a micro-electro-mechanical devices (MEMS)/nanotechnology course for university students.

UR - http://www.scopus.com/inward/record.url?scp=0034847239&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0034847239&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0034847239

VL - 7

SP - 73673

EP - 73682

BT - IEEE Aerospace Conference Proceedings

T2 - 2001 IEEE Aerospace Conference

Y2 - 10 March 2001 through 17 March 2001

ER -

Taking atomic force microscope advances to the university classroom

Abstract

Other

ASJC Scopus subject areas

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